WCFS1008C3E Datasheet, PDF (2/8 Pages) Weida Semiconductor, Inc. – 128K x 8 Static RAM

WCFS1008C3E
WCFS1008C9E
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature ................................. –65°C to +150°C
Ambient Temperature with
Power Applied............................................. –55°C to +125°C
Supply Voltage on V_CC to Relative GND^[1] .... –0.5V to +7.0V
DC Voltage Applied to Outputs
in High Z State^[1] ....................................–0.5V to V_CC + 0.5V
DC Input Voltage^[1].................................–0.5V to V_CC + 0.5V
Electrical Characteristics Over the Operating Range
Current into Outputs (LOW) ........................................ 20 mA
Static Discharge Voltage............................................ >2001V
(per MIL-STD-883, Method 3015)
Latch-Up Current..................................................... >200 mA
Operating Range
Range
Commercial
Ambient
Temperature^[2]
0°C to +70°C
V_CC
5V ± 10%
Parameter
Description
V_OH
Output HIGH Voltage
V_OL
Output LOW Voltage
V_IH
Input HIGH Voltage
V_IL
Input LOW Voltage^[1]
I_IX
Input Load Current
I_OZ
Output Leakage
Current
I_OS
Output Short
Circuit Current^[3]
I_CC
V_CC Operating
Supply Current
I_SB1
Automatic CE
Power-Down Current
—TTL Inputs
I_SB2
Automatic CE
Power-Down Current
—CMOS Inputs
Test Conditions
V_CC = Min.,
I_OH = –4.0 mA
V_CC = Min.,
I_OL = 8.0 mA
GND < V_I < V_CC
GND < V_I < V_CC,
Output Disabled
V_CC = Max.,
V_OUT = GND
V_CC = Max.,
I_OUT = 0 mA,
f = f_MAX = 1/t_RC
Max. V_CC, CE₁ > V_IH
or CE₂ < V_IL,
V_IN > V_IH or
V_IN < V_IL, f = f_MAX
Max. V_CC,
CE₁ > V_CC – 0.3V,
or CE₂ < 0.3V,
V_IN > V_CC – 0.3V,
or V_IN < 0.3V, f = 0
WCFS1008C3E
WCFS1008C9E 15ns
Min.
Max.
Unit
2.4
V
0.4
V
2.2
V_CC
V
+ 0.3
–0.3
0.8
V
–1
+1
µA
–5
+5
µA
–300
mA
80
mA
40
mA
10
mA
Capacitance^{[ 4]}
Parameter
Description
Test Conditions
Max.
C_IN
Input Capacitance
T_A = 25°C, f = 1 MHz,
9
V_CC = 5.0V
C_OUT
Output Capacitance
8
Note:
1. V_IL (min.) = –2.0V for pulse durations of less than 20 ns.
2. T_A is the case temperature.
3. Not more than one output should be shorted at one time. Duration of the short circuit should not exceed 30 seconds.
4. Tested initially and after any design or process changes that may affect these parameters.
Unit
pF
pF
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