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ACAS0612_13 Datasheet, PDF (6/8 Pages) Vishay Siliconix – Precision Thin Film Chip Resistor Array
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TESTS AND REQUIREMENTS
Essentially all tests are carried out in accordance with the
following specifications:
EN 60115-1, generic specification
EN 140400, sectional specification
EN 140401-801, detail specification
The testing also covers most of the requirements specified
by EIA/IS-703 and JIS-C-5202.
The tests are carried out in accordance with IEC 60068 (1)
and under standard atmospheric conditions according to
IEC 60068-1 (1), 5.3. Climatic category LCT/UCT/56 (rated
temperature range: Lower category temperature, upper
ACAS 0612 - Precision
Vishay Beyschlag
category temperature; damp heat, long term, 56 days) is
valid (LCT = - 55 °C/UCT = 125 °C).
Unless otherwise specified the following values apply:
Temperature: 15 °C to 35 °C
Relative humidity: 45 % to 75 %
Air pressure: 86 kPa to 106 kPa (860 mbar to 1060 mbar)
The requirements stated in the “Test Procedures and
Requirements” table are based on the required tests and
permitted limits of EN 140401-801 where applicable.
TEST PROCEDURES AND REQUIREMENTS
EN
60 115-1
CLAUSE
IEC
60 068-2 (1)
TEST
METHOD
TEST
PROCEDURE
Stability for product types:
ACAS 0612
4.5
-
Resistance
-
4.8.4.2
4.25.1
4.25.3
4.24
4.13
4.19
-
Temperature coefficient
Endurance at 70 °C:
Precision operation mode
-
Endurance at 70 °C:
Standard operation mode
-
Endurance at upper
category temperature
78 (Cab)
-
Damp heat,
steady state
Short time overload (3)
Standard operation mode
14 (Na)
Rapid change of
temperature
At (20/-55/20) °C and
(20/125/20) °C
U = P70 x R or U = Umax.;
1.5 h on; 0.5 h off;
whichever is the less severe;
1000 h:
Absolute
Relative
8000 h:
Absolute
Relative
U = P70 x R or U = Umax.;
1.5 h on; 0.5 h off;
whichever is the less severe;
1000 h:
Absolute
Relative
8000 h:
Absolute
Relative
85 °C; 1000 h:
Absolute
Relative
125 C; 1000 h:
Absolute
Relative
(40 ± 2) °C; 56 days;
(93 ± 3) % RH
U = 2.5 x P70 x R or
U = 2 x Umax.; 5 s
30 min at - 55 °C and
30 min at 125 °C;
5 cycles
REQUIREMENTS
PERMISSIBLE CHANGE (2)
(R)
47  to 221 k
± 0.1 % R
± 25 ppm/K; ± 15 ppm/K; ± 10 ppm/K
± (0.1 % R + 0.05 )
± (0.05 % R + 0.05 )
± (0.25 % R + 0.05 )
± (0.125 % R + 0.05 )
± (0.25 % R + 0.05 )
± (0.125 % R + 0.05 )
± (0.5 % R + 0.05 )
± (0.25 % R + 0.05 )
± (0.1 % R + 0.05 )
± (0.05 % R + 0.05 )
± (0.25 % R + 0.05 )
± (0.125 % R + 0.05 )
± (0.25 % R + 0.05)
± (0.1 % R + 0.01 )
no visible damage
± (0.1 % R + 0.01)
no visible damage
Revision: 12-Apr-13
6
Document Number: 28751
For technical questions, contact: thinfilmarray@vishay.com
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ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000