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DG417_10 Datasheet, PDF (4/16 Pages) Vishay Siliconix – Precision CMOS Analog Switches
DG417, DG418, DG419
Vishay Siliconix
SPECIFICATIONSa
Parameter
Symbol
Dynamic Characteristics
Source Off
Capacitance
CS(off)
Drain Off Capacitance CD(off)
Channel On
Capacitance
CD(on)
Power Supplies
Positive Supply Current I+
Negative Supply
Current
I-
Logic Supply Current
IL
Ground Current
IGND
Test Conditions
Unless Otherwise Specified
V+ = 15 V, V- = - 15 V
VL = 5 V, VIN = 2.4 V, 0.8 Vf
A Suffix
D Suffix
- 55 °C to 125 °C - 40 °C to 85 °C
Temp.b Typ.c Min.d Max.d Min.d Max.d Unit
Room
8
f = 1 MHz, VS = 0 V
DG417
DG418
Room
8
pF
f = 1 MHz, VS = 0 V
DG417
DG418
Room
30
DG419 Room
35
V+ = 16.5 V, V- = - 16.5 V
VIN = 0 or 5 V
Room 0.001
1
1
Full
5
5
Room - 0.001 - 1
-1
Full
-5
-5
µA
Room 0.001
1
1
Full
5
5
Room - 0.0001 - 1
-1
Full
-5
-5
SPECIFICATIONSa for Unipolar Supplies
Test Conditions
Unless Otherwise Specified
V+ = 12 V, V- = 0 V
Parameter
Symbol
VL = 5 V, VIN = 2.4 V, 0.8 Vf
Analog Switch
Analog Signal Rangee VANALOG
Drain-Source
On-Resistance
RDS(on)
IS = - 10 mA, VD = 3.8 V
V+ = 10.8 V
Dynamic Characteristics
Turn-On Time
Turn-Off Time
tON
RL = 300 , CL = 35 pF, VS = 8 V
tOFF
See Switching Time Test Circuit
Break-Before-Make
Time Delay
tD
DG419 Only
RL = 300 , CL = 35 pF
Charge Injection
Q
CL = 10 nF, Vgen = 0 V, Rgen = 0 
Power Supplies
Positive Supply
Current
I+
Negative Supply
Current
Logic Supply
Current
I-
V+ = 13.2 V, VL = 5.25 V
IL
VIN = 0 or 5 V
Ground
Current
IGND
Temp.b
Full
Room
Room
Room
Room
Room
Room
Room
Room
Room
A Suffix
D Suffix
- 55 °C to 125 °C - 40 °C to 85 °C
Typ.c Min.d Max.d Min.d Max.d Unit
0
12
0
12
V
40

110
40
ns
60
5
pC
0.001
- 0.001
µA
0.001
- 0.001
Notes:
a. Refer to Process Option Flowchart.
b. Room = 25 °C, Full = as determined by the operating temperature suffix.
c. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.
d. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
e. Guaranteed by design, not subject to production test.
f. VIN = input voltage to perform proper function.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
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Document Number: 70051
S10-1528-Rev. G, 19-Jul-10