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SI7431DP-T1-GE3 Datasheet, PDF (2/8 Pages) Vishay Siliconix – P-Channel 200 V (D-S) MOSFET
Si7431DP
Vishay Siliconix
SPECIFICATIONS (TJ = 25 °C, unless otherwise noted)
Parameter
Symbol
Test Condition
Min.
Typ.
Max.
Unit
Static
Gate Threshold Voltage
Gate-Body Leakage
VGS(th)
IGSS
VDS = VGS, ID = - 250 µA
VDS = 0 V, VGS = ± 20 V
- 2.0
- 4.0
V
± 100
nA
Zero Gate Voltage Drain Current
On-State Drain Currenta
IDSS
VDS = - 200 V, VGS = 0 V
VDS = - 200 V, VGS = 0 V, TJ = 70 °C
ID(on)
VDS - 10 V, VGS = - 10 V
- 20
-1
µA
- 10
A
Drain-Source On-State Resistancea
Forward Transconductancea
Diode Forward Voltagea
Dynamicb
RDS(on)
gfs
VSD
VGS = - 10 V, ID = - 3.8 A
VGS = - 6 V, ID = - 3.6 A
VDS = - 15 V, ID = - 3.8 A
IS = - 4.2 A, VGS = 0 V
0.145 0.174

0.147 0.180
17
S
- 0.78
- 1.2
V
Total Gate Charge
Qg
88
135
Gate-Source Charge
Qgs
VDS = - 75 V, VGS = - 10 V, ID = - 5.2 A
16.5
nC
Gate-Drain Charge
Qgd
25
Gate Resistance
Rg
1.5
3
4.5

Turn-On Delay Time
td(on)
23
40
Rise Time
Turn-Off Delay Time
tr
td(off)
VDD = - 75 V, RL = 15.5 
ID  - 4.8 A, VGEN = - 10 V, Rg = 6 
49
75
110
180
ns
Fall Time
tf
66
100
Source-Drain Reverse Recovery Time
trr
IF = - 2.9 A, dI/dt = 100 A/µs
75
120
Notes:
a. Pulse test; pulse width  300 µs, duty cycle  2 %.
b. Guaranteed by design, not subject to production testing.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
TYPICAL CHARACTERISTICS (25 °C, unless otherwise noted)
40
VGS = 10 V thru 5 V
35
30
25
20
15
10
5
4V
0
0
2
4
6
8
10
VDS - Drain-to-Source Voltage (V)
Output Characteristics
50
40
30
20
TC = 125 °C
10
25 °C
- 55 °C
0
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0
VGS - Gate-to-Source Voltage (V)
Transfer Characteristics
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Document Number: 73116
S10-2246-Rev. E, 04-Oct-10