SI7123DN Datasheet, PDF (2/13 Pages) Vishay Siliconix – P-Channel 20 V (D-S) MOSFET

Si7123DN
Vishay Siliconix
New Product
SPECIFICATIONS T_J = 25 °C, unless otherwise noted
Parameter
Symbol
Test Conditions
Static
Drain-Source Breakdown Voltage
V_DS Temperature Coefficient
V_GS(th) Temperature Coefficient
Gate-Source Threshold Voltage
Gate-Source Leakage
Zero Gate Voltage Drain Current
On-State Drain Current^a
Drain-Source On-State Resistance^a
Forward Transconductance^a
Dynamic^b
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Total Gate Charge
V_DS
ΔV_DS/T_J
ΔV_GS(th)/T_J
V_GS(th)
I_GSS
I_DSS
I_D(on)
R_DS(on)
g_fs
V_GS = 0 V, I_D = - 250 µA
I_D = - 250 µA
V_DS = V_GS, I_D = - 250 µA
V_DS = 0 V, V_GS = ± 8 V
V_DS = - 20 V, V_GS = 0 V
V_DS = - 20 V, V_GS = 0 V, T_J = 55 °C
V_DS ≤ - 5 V, V_GS = - 4.5 V
V_GS = - 4.5 V, I_D = - 15 A
V_GS = - 2.5 V, I_D = - 11.2 A
V_GS = - 1.8 V, I_D = - 5 A
V_DS = - 15 V, I_D = - 4 A
C_iss
C_oss
C_rss
Q_g
V_DS = - 10 V, V_GS = 0 V, f = 1 MHz
V_DS = - 10 V, V_GS = - 4.5 V, I_D = - 15 A
Gate-Source Charge
Gate-Drain Charge
Q_gs
V_DS = - 10 V, V_GS = - 2.5 V, I_D = - 15 A
Q_gd
Gate Resistance
R_g
f = 1 MHz
Turn-On Delay Time
t_d(on)
Rise Time
Turn-Off DelayTime
t_r
t_d(off)
V_DD = - 10 V, R_L = 0.77 Ω
I_D ≅ - 13 A, V_GEN = - 4.5 V, R_g = 1 Ω
Fall Time
t_f
Drain-Source Body Diode Characteristics
Continuous Source-Drain Diode Current
I_S
Pulse Diode Forward Current^a
I_SM
T_C = 25 °C
Body Diode Voltage
V_SD
I_S = - 13 A
Body Diode Reverse Recovery Time
t_rr
Body Diode Reverse Recovery Charge
Reverse Recovery Fall Time
Q_rr
t_a
I_F = - 13 A, dI/dt = 100 A/µs, T_J = 25 °C
Reverse Recovery Rise Time
t_b
Notes:
a. Pulse test; pulse width ≤ 300 µs, duty cycle ≤ 2 %.
b. Guaranteed by design, not subject to production testing.
Min.
- 20
- 0.4
- 40
Typ.
- 19
3
0.0086
0.0112
0.0156
27
3729
542
475
57
35.5
4.5
16.1
2.0
25
88
82
28
- 0.76
48
45
19
29
Max.
-1
± 100
-1
- 10
0.0106
0.0136
0.0189
90
55
50
150
150
45
- 25
- 40
- 1.2
80
80
Unit
V
mV/°C
V
nA
µA
A
Ω
S
pF
nC
Ω
ns
A
V
ns
nC
ns
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
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Document Number: 69655
S10-0347-Rev. D, 15-Feb-10