SI5997DU Datasheet, PDF (2/9 Pages) Vishay Siliconix – Dual P-Channel 30 V (D-S) MOSFET

Si5997DU
Vishay Siliconix
SPECIFICATIONS (T_J = 25 °C, unless otherwise noted)
Parameter
Symbol
Test Conditions
Static
Drain-Source Breakdown Voltage
V_DS Temperature Coefficient
V_GS(th) Temperature Coefficient
Gate-Source Threshold Voltage
Gate-Source Leakage
Zero Gate Voltage Drain Current
On-State Drain Current^a
Drain-Source On-State Resistance^a
Forward Transconductance^a
Dynamic^b
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Total Gate Charge
V_DS
V_DS/T_J
V_GS(th)/T_J
V_GS(th)
I_GSS
I_DSS
I_D(on)
R_DS(on)
g_fs
V_GS = 0 V, I_D = - 250 µA
I_D = - 250 µA
V_DS = V_GS, I_D = - 250 µA
V_DS = 0 V, V_GS = ± 20 V
V_DS = - 30 V, V_GS = 0 V
V_DS = - 30 V, V_GS = 0 V, T_J = 55 °C
V_DS - 5 V, V_GS = - 10 V
V_GS = - 10 V, I_D = - 3 A
V_GS = - 4.5 V, I_D = - 1 A
V_DS = - 15 V, I_D = - 3 A
C_iss
C_oss
C_rss
Q_g
V_DS = - 15 V, V_GS = 0 V, f = 1 MHz
V_DS = - 15 V, V_GS = - 10 V, I_D = - 5.1 A
Gate-Source Charge
Gate-Drain Charge
Q_gs
V_DS = - 15 V, V_GS = - 4.5 V, I_D = - 5.1 A
Q_gd
Gate Resistance
R_g
f = 1 MHz
Turn-On Delay Time
t_d(on)
Rise Time
Turn-Off Delay Time
Fall Time
t_r
t_d(off)
t_f
V_DD = - 15 V, R_L = 3.7 
I_D  - 4.1 A, V_GEN = - 4.5 V, R_g = 1 
Turn-On Delay Time
t_d(on)
Rise Time
Turn-Off Delay Time
Fall Time
t_r
t_d(off)
t_f
V_DD = - 15 V, R_L = 3.7 
I_D  - 4.1 A, V_GEN = - 10 V, R_g = 1 
Drain-Source Body Diode Characteristics
Continuous Source-Drain Diode Current
I_S
T_C = 25 °C
Pulse Diode Forward Current
I_SM
Body Diode Voltage
V_SD
Body Diode Reverse Recovery Time
t_rr
I_S = - 4.1 A, V_GS = 0 V
Body Diode Reverse Recovery Charge
Reverse Recovery Fall Time
Q_rr
t_a
I_F = - 4 A, dI/dt = 100 A/µs, T_J = 25 °C
Reverse Recovery Rise Time
t_b
Notes:
a. Pulse test; pulse width  300 µs, duty cycle  2 %.
b. Guaranteed by design, not subject to production testing.
Min.
- 30
- 1.2
- 20
2
Typ.
Max.
Unit
- 22
4.1
0.045
0.072
7
- 2.4
± 100
-1
- 10
0.054
0.088
V
mV/°C
V
nA
µA
A

S
430
90
pF
70
9.5
14.5
4.8
7.5
nC
1.6
2.2
8
16

35
70
25
50
17
35
10
20
ns
10
20
10
20
20
40
10
20
-6
A
- 25
- 0.85 - 1.2
V
15
30
ns
8
15
nC
10.5
ns
4.5
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
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Document Number: 67186
S10-2762-Rev. A, 29-Nov-10