CCFCCA-25M125 Datasheet, PDF (6/7 Pages) Vectron International, Inc – 3.3, 5.0 volt CMOS Oscillator

C-TYPE Data Sheet
Reliability
The C-TYPE qualification tests have included:
Table 5. Environnemental Compliance
Parameter
Mechanical Shock
Mechanical Vibration
Temperature Cycle
Solderability
Gross and Fine Leak
Resistance to Solvents
Moisture Sensitivity Level
Contact Pads
Conditions
MIL-STD-883 Method 2022
MIL-STD-883 Method 2007
MIL-STD-883 Method 1010
MIL-STD-883 Method 2003
MIL-STD-883 Method 1014
MIL-STD-883 Method 2015
1
Gold over Nickel
Handling Precautions
Although ESD protection circuitry has been designed into the the C-TYPE, proper precautions should be
taken when handling and mounting. VI employs a Human Body Model and a Charged-Device Model (CDM)
for ESD susceptibility testing and design protection evaluation. ESD thresholds are dependent on the circuit
parameters used to define the model. Although no industry wide standard has been adopted for the CDM, a
standard HBM of resistance = 1.5kohms and capacitance = 100pF is widely used and therefore can be
used for comparison purposes.
Table 6. ESD Ratings
Model
Minimum
Conditions
Human Body Model
1000
MIL-STD-883 Method 3115
Charged Device Model
1500
JESD 22-C101
Suggested IR profile
Devices are built using lead free epoxy and can also be subjected to standard lead free IR reflow conditions,
Table 9 shows max temperatures and lower temperatures can also be used e.g. peak temperature of 220C.
Table 7. Reflow Profile
Parameter
Symbol
Value
Preheat Time
t_S
150 sec Min, 200 sec Max
Ramp Up
Time Above 217 ^oC
Time To Peak Temperature
Time At 260 ^oC (max)
Time At 240 °C (max)
Ramp Down
R _UP
t_L
t _AMB-P
t_P
t_p2
R _DN
3 ^oC/sec Max
60 sec Min, 150 sec Max
480 sec Max
10 sec Max
60 sec Max
6 ^oC/sec Max
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