TLP106_07 Datasheet, PDF (5/6 Pages) Toshiba Semiconductor – PHOTO-IC Intelligent Power Module Signal Isolation

TEST CIRCUIT 7: Switching Time Test Circuit
IF
IF
VCC
0.1uF
GND
SHIELD
VO
CL
VOH
VCC
V_O
VOL
tpLH
1.3V
tr
TEST CIRCUIT 8: Switching Time Test Circuit
VCC VO
5V
IF
IF
VCC
0.1uF
620Ω
VOH
GND
SHIELD
CL 5kΩ
V_O
VOL
CL: stray capacitance of probe and wiring (to 15 pF)
tpLH
1.3V
tr
TLP106
tpHL
50%
90%
10%
tf
tpHL
50%
90%
10%
tf
TEST CIRCUIT 9: Common-Mode Transient Immunity Test Circuit
SW _→ ^１
IF
A
B
3
6
VCC
5
GND ⁴
SHIELD
VC_ï¼­
0.1uF
VO
VCM
VCC
・SW A : IF=5mA
V_O
・SW B : IF=0mA
tr
１V
CM _L
=
800(V )
t _r ^(μs)
1000Ｖ
90%
10%
tf
CM_H
17V
CM_L
CM _H
=
800(V )
t _f ^(μs)
5
2007-10-01