TLP106_07 Datasheet, PDF (4/6 Pages) Toshiba Semiconductor – PHOTO-IC Intelligent Power Module Signal Isolation

Switching Characteristics
(Unless otherwise specified, Ta = -40 to 85°C, VCC = 4.5~20 V.）
CHARACTERISTIC
Propagation Delay Time
to Logic HIGH Output
Propagation Delay Time
to Logic LOW Output
Switching Time Dispersion
between ON and OFF
Output Rise Time
Output Fall Time
Propagation Delay Time
to Logic HIGH Output
Propagation Delay Time
to Logic LOW Output
Common-Mode Transient
Immunity at HIGH Level
Output
Common-Mode Transient
Immunity at LOW Level
Output
TEST
SYMBOL _CIRCUIT
CONDITION
tpLH
IF = 0→5mA、CL = 100 pF
VCC = 20 V
tpHL
|tpHL-
tpLH|
IF = 5→0 mA、CL = 100 ｐF
VCC = 20 V
7
CL = 100 PF
tr
IF = 0→5 mA, VCC = 20 V
tf
IF = 5→0 mA, VCC = 20 V
tpLH
tpHL
IF = 0→5 mA
8
IF = 5→0 mA
MIN. TYP.
50
250
50
260
―
―
―
175
―
95
50
―
50
―
CMH
CML
VCM = 1000 Vp-p, IF = 5 mA,
-10000 ―
VCC = 20 V,Ta = 25°C
9
VCM = 1000 Vp-p, IF = 0 mA,
10000
―
VCC = 20 V,Ta = 25°C
*All typical values are at Ta = 25°C.
TLP106
MAX. UNIT
400
ns
400
ns
350
ns
―
ns
―
ns
400
ns
400
ns
―
V/us
―
V/us
TEST CIRCUIT 1 : VOL
1
6
VCC
0.1uF
5
V_CC
3
GND ⁴
V_OL IOL
V↑
SHIELD
TEST CIRCUIT 2 : VOH
IF
→
1
↑
3
6
VCC
5
GND ⁴
SHIELD
V ^{VOH ↑ IOH}
V_CC
0.1uF
TEST CIRCUIT 3 : ICCL
1
6
ICCL
VCC
A
5
V_CC
3
GND ⁴
SHIELD
TEST CIRCUIT 5 : IOSL
1
6
VCC
5 ^0.1uF
A
3
IOSL
GND ⁴
VCC
SHIELD
VO
TEST CIRCUIT 4 : ICCH
IF
→
1
ICCH
6
VCC
A
↑
5
V_CC
3
GND ⁴
SHIELD
TEST CIRCUIT 6 : IOSH
IF 1
→
6
VCC
5
↑
3
GND ⁴
SHIELD
0.1uF
A
IOSH
V_O
V_CC
4
2007-10-01