TLP3312 Datasheet, PDF (4/8 Pages) Toshiba Semiconductor – Battery Control Measuring Instruments Logic IC Testers / Memory Testers

I _F ─ Ta
100
80
60
40
20
0-20
0
20
40
60
80 100 120
Ambient temperature Ta (°C)
100
50 ^{Ta = 25 °C}
30
I _F ─ VF
10
5
3
1
0.5
0.3
0.1
0.6
0.8
1
1.2
1.4
1.6
1.8
Forward voltage VF (V)
RON ─ Ta
2.0
1.8
IF = 5mA
ION = 400mA
1.6
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0.0
-40 -20 0 20 40 60 80 100
Ambient temperature Ta (°C)
*: The above graphs show typical characteristics.
TLP3312
I _ON ─ Ta
500
400
300
200
100
0-20
0
20
40
60
80 100 120
Ambient temperature Ta (°C)
I _ON ─ VON
500
Ta = 25 °C
400
I _F = 5 mA
300
200
100
0
-100
-200
-300
-400
-50-0500 _{-400 -300 -200 -100 0 100 200 300 400 500}
On-sate voltage VON (mV)
I _FT ─ Ta
0.8
ION = 400mA
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0.00
-40 -20 0 20 40 60 80 100
Ambient temperature Ta (°C)
4
2014-09-01