TLP2166A Datasheet, PDF (4/11 Pages) Toshiba Semiconductor – PHOTOCOUPLER GaAℓAs Ired & PHOTO-IC

TLP2166A
Switching Characteristics
(Unless otherwise specified, Ta=-40 to 100℃､VCC=3.0 to 3.6 V)(Each Channel)
CHARACTERISTIC
TEST
SYMBOL _CIRCUIT
CONDITION
MIN TYP. MAX UNIT
Propagation Delay Time
to Logic Low output
Propagation Delay Time
to Logic High output
Switching Time Dispersion
between ON and OFF
Fall Time (90 – 10 %)
Rise Time (10 – 90 %)
Common Mode transient
Immunity at High Level Output
Common Mode transient
Immunity at Low Level Output
tpHL
tpLH
|tpHL-
tpLH|
tf
tr
CMH
CML
IF=0→7.5 mA
R_IN=100 Ω
―
―
CL=15 pF
IF=7.5→0 mA
(Note 6)
―
―
5
IF=7.5 mA,R_IN=100Ω,CL=15 pF
―
―
(Note 6)
IF=0→7.5 mA
R_IN=100 Ω
―
5
CL=15 pF
IF=7.5→0 mA
(Note 6)
―
5
VCM=1000 V_p-p, IF=0 mA,
VO(min)=2 V, Ta=25°C
15000 ―
6
VCM=1000 Vp-p, IF=7.5 mA,
VO(max)=0.8 V, Ta=25°C
-15000 ―
75
ns
75
ns
45
ns
―
ns
―
ns
―
V/μs
―
V/μs
*All typical values are at Ta=25°C, VCC=3.3 V.
Note 6: CL is approximately 15 pF which includes probe and jig/stray wiring capacitance.
TEST CIRCUIT 1: VOL Test Circuit
1
IF
8
VCC
2
7
TEST CIRCUIT 2: VOH Test Circuit
VF ¹
8
VCC
2
7
IO _VO
V
3
6
IO VOL ^VCC
3
6
VCC
4
GND ^{5 0.1 μF}
V
4
GND ^{5 0.1 μF}
SHIELD
SHIELD
TEST CIRCUIT 3: ICCL Test Circuit
1
IF1
8
VCC
ICCL
A
2
7
3
4
IF2
6
GND ⁵
SHIELD
0.1 μF
VCC
TEST CIRCUIT 4: ICCH Test Circuit
1
8 ^ICCH
VCC
A
2
7
3
6 0.1 μF
VCC
4
GND ⁵
SHIELD
4
2008-11-27