TA1296FN Datasheet, PDF (11/22 Pages) Toshiba Semiconductor – Down-Converter IC with PLL for Satellite Tuner

TA1296FN
Test Conditions
(1) Conversion gain
RF input level = -40dBmW
(2) Noise figure
NF meter direct-reading value (DSB measurement)
(3) IF output power level
Measure maximum IF output level.
(4) 3^rd inter modulation
· fd (fd input level = -40dBmW) · fud = fd + 5 MHz (fud input level = -40dBmW)
Calculate IF output intercept point as follows:
IP3 = S/(N - 1) + P [dBmW]
S: suppression level N: 3 P: IF output level
(5) Conversion gain shift
Conversion gain shift is defined as change in conversion gain when supply voltage exceeds ranges
VCC = 5 V to 4.5 V or VCC = 5 V to 5.5 V.
(6) Frequency shift (PLL OFF)
Frequency shift is defined as change in oscillator frequency when supply voltage exceeds ranges
VCC1 = 5 V to 4.5 V or VCC1 = 5 V to 5.5 V.
(7) Phase noise (offset = 10 kHz)
Measure phase noise at 10-kHz offset.
(8) RF pin local-leak level
Measure worst-case local-leak level for RF pin (with IF output pin open).
(9) IF pin local-leak level
Measure worst-case local-leak level for IF pin (with RF input pins shorted using 50-W resistor).
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2002-02-12