CD4010B-Q1 Datasheet, PDF (9/14 Pages) Texas Instruments – CMOS HEX BUFFER/CONVERTER

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CD4010B-Q1
SCHS379A – MARCH 2010 – REVISED JANUARY 2012
PARAMETER MEASUREMENT INFORMATION
Figure 15. Quiescent Device Current Test Circuit
Figure 16. Noise Immunity Test Circuit
Figure 17. Input Current Test Circuit
Note:
Dimensions in parentheses are in millimeters and are dereived from the basic inch dimensions as indicated. Grid
graduation are in mils (10^–3 inch).
Figure 18. Dimensions and Layout
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