CD4010B-Q1 Datasheet, PDF (2/14 Pages) Texas Instruments – CMOS HEX BUFFER/CONVERTER

CD4010B-Q1
SCHS379A – MARCH 2010 – REVISED JANUARY 2012
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
Figure 1. Schematic Diagram – One of Six Identical Stages
Functional Diagram
2
Submit Documentation Feedback
Copyright © 2010–2012, Texas Instruments Incorporated
Product Folder Link(s): CD4010B-Q1