OPA180-Q1 Datasheet, PDF (8/32 Pages) Texas Instruments – 0.1-uV/C Drift, Low-Noise, Rail-to-Rail Output, 36-V, Zero-Drift Operational Amplifiers

OPA180-Q1, OPA2180-Q1
SBOS861 – MAY 2017
www.ti.com
7.6 Electrical Characteristics: V_S = ±2 V to ±18 V (V_S = 4 V to 36 V)
at T_A = 25°C, R_L = 10 kΩ connected to V_S / 2, and V_COM = V_OUT = V_S / 2, (unless otherwise noted)
PARAMETER
CONDITIONS
MIN
TYP
OFFSET VOLTAGE
V_IO
Input offset voltage
15
dV_IO/dT Input offset voltage drift
T_A = –40°C to 105°C
0.1
V_S = 4 V to 36 V
V_CM = V_S / 2
0.1
PSRR
Power-supply rejection ratio
T_A = –40°C to 105°C,
V_S = 4 V to 36 V
V_CM = V_S / 2
Long-term stability
4 ⁽¹⁾
Channel separation, dc
1
INPUT BIAS CURRENT
OPA2180-Q1
±0.25
I_IB
Input bias current
OPA2180-Q1:
T_A = –40°C to 105°C
OPA180-Q1
18
±0.25
OPA180-Q1:
T_A = –40°C to 105°C
OPA2180-Q1
18
±0.5
I_IO
Input offset current
OPA2180-Q1:
T_A = –40°C to 105°C
OPA180-Q1
6
NOISE
OPA180-Q1:
T_A = –40°C to 105°C
6
Input voltage noise
ƒ = 0.1 Hz to 10 Hz
0.25
e_n
Input voltage noise density
ƒ = 1 kHz
10
i_n
Input current noise density
ƒ = 1 kHz
10
INPUT VOLTAGE RANGE
V_CM
CMRR
Common-mode voltage range
Common-mode rejection ratio
INPUT IMPEDANCE
(V–) < V_CM < (V+) – 1.5 V
T_A = –40°C to 105°C
(V–) + 0.5 V < V_CM < (V+) – 1.5 V
V–
104
114
100
104
z_id
Differential
100 || 6
z_ic
Common-mode
6 || 9.5
OPEN-LOOP GAIN
A_OL
Open-loop voltage gain
FREQUENCY RESPONSE
(V–) + 500 mV < V_O < (V+) – 500 mV
R_L = 10 kΩ
T_A = –40°C to 105°C
(V–) + 500 mV < V_O < (V+) – 500 mV
R_L = 10 kΩ
110
120
104
114
GBW
Gain bandwidth product
2
SR
Slew rate
G=1
0.8
t_s
t_or
THD+N
Settling time
0.1%
0.01%
Overload recovery time
Total harmonic distortion + noise
V_S = ±18 V, G = 1, 10-V step
V_S = ±18 V, G = 1, 10-V step
V_IN × G = V_S
ƒ = 1 kHz, G = 1, V_OUT = 1 V_RMS
22
30
1
0.0001%
MAX UNIT
75
μV
0.35 μV/°C
0.5
μV/V
0.5
μV/V
μV
μV/V
±1
nA
±5
nA
±1.7
nA
±6
nA
±2
nA
±2.5
nA
±3.4
nA
±3
nA
μV_PP
nV/√Hz
fA/√Hz
(V+) – 1.5
V
dB
dB
MΩ || pF
10¹² Ω || pF
dB
dB
MHz
V/μs
μs
μs
μs
(1) 1000-hour life test at 125°C demonstrated randomly distributed variation in the range of measurement limits, or approximately 4 μV.
8
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