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LPV521_16 Datasheet, PDF (8/34 Pages) Texas Instruments – NanoPower, 1.8-V, RRIO, CMOS Input, Operational Amplifier | |||
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LPV521
SNOSB14D â AUGUST 2009 â REVISED DECEMBER 2014
www.ti.com
5-V DC Electrical Characteristics (continued)
Unless otherwise specified, all limits for TA = 25°C, V+ = 5 V, Vâ = 0 V, VCM = VO = V+/2, and RL > 1 MΩ.(1)
PARAMETER
TEST CONDITIONS
MIN
TYP
VO
Output Swing High
RL = 100 k⦠to V+/2
3
VIN(diff) = 100 mV
Temperature extremes
Output Swing Low
RL = 100 k⦠to V+/2
3
VIN (diff) = â100 mV
Temperature extremes
IO
Output Current
Sourcing, VO to Vâ
VIN(diff) = 100 mV
Temperature extremes
Sinking, VO to V+
VIN(diff) = â100 mV
Temperature extremes
15
23
8
15
22
8
IS
Supply Current
VCM = 0.3 V
351
Temperature extremes
VCM = 4.7 V
475
Temperature extremes
MAX
50
50
50
50
400
620
600
870
UNIT
mV from
either rail
mA
nA
6.10 5-V AC Electrical Characteristics(1)
Unless otherwise specified, all limits for TA = 25°C, V+ = 5 V, Vâ = 0 V, VCM = VO = V+/2, and RL > 1 MΩ.
PARAMETER
TEST CONDITIONS
MIN
(2)
TYP
(3)
MAX
(2)
UNIT
GBW
SR
θm
Gm
en
In
EMIRR
Gain-Bandwidth Product
Slew Rate
Phase Margin
Gain Margin
Input-Referred Voltage Noise Density
Input-Referred Voltage Noise
Input-Referred Current Noise
EMI Rejection Ratio, IN+ and INâ(4)
CL = 20 pF, RL = 100 kâ¦
AV = +1,
VIN = 0 V to 5 V
Falling Edge
Temperature
extremes
Rising Edge
Temperature
extremes
CL = 20 pF, RL = 100 kâ¦
CL = 20 pF, RL = 100 kâ¦
f = 100 Hz
0.1 Hz to 10 Hz
f = 100 Hz
VRF_PEAK = 100 mVP (â20 dBP),
f = 400 MHz
VRF_PEAK = 100 mVP (â20 dBP),
f = 900 MHz
VRF_PEAK = 100 mVP (â20 dBP),
f = 1800 MHz
VRF_PEAK = 100 mVP (â20 dBP),
f = 2400 MHz
6.2
1.1
2.7
1.2
1.1
2.4
1.2
73
20
255
22
100
121
121
124
142
kHz
V/ms
deg
dB
nV/âHz
μVPP
fA/âHz
dB
(1) Electrical Characteristics values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in
very limited self-heating of the device such that TJ = TA. No guarantee of parametric performance is indicated in the electrical tables
under conditions of internal self-heating where TJ TA. Absolute Maximum Ratings indicate junction temperature limits beyond which the
device may be permanently degraded, either mechanically or electrically.
(2) All limits are guaranteed by testing, statistical analysis or design.
(3) Typical values represent the most likely parametric norm at the time of characterization. Actual typical values may vary over time and
will also depend on the application and configuration. The typical values are not tested and are not guaranteed on shipped production
material.
(4) The EMI Rejection Ratio is defined as EMIRR = 20log (VRF_PEAK/ÎVOS).
8
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