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| BQ28550-R1 Datasheet, PDF (8/42 Pages) Texas Instruments – Single Cell Li-Ion Battery Gas Gauge | |||
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Not Recommended for New Designs
bq28550-R1
SLUSAS4A â OCTOBER 2012 â REVISED SEPTEMBER 2014
www.ti.com
Electrical Characteristics: Integrating ADC (Coulomb Counter) Characteristics (continued)
TA = â40 to +85ºC, VBAT = 2.7 V to 5.5 V; Typical values stated, where TA = 25ºC and VBAT = 3.6 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VOS(SR)
INL
Input offset
Integral nonlinearity error
10
±0.007
±0.034
µV
FSR (1)
ZIN(SR)
Ilkg(SR)
Effective input
resistance (2)
Input leakage current(2)
2.5
Mâ¦
0.3
µA
(1) Full-scale reference
(2) Specified by design. Not production tested.
6.12 Electrical Characteristics: ADC (Temperature and Cell Voltage) Characteristics
TA = â40 to +85ºC, VBAT = 2.7 V to 5.5 V; Typical values stated, where TA = 25ºC and VBAT = 3.6 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VIN(ADC)
tCONV(ADC)
Input voltage range
Conversion time
Resolution
â0.2
1
V
125
ms
14
15
bits
VOS(ADC)
Z(ADC1)
Input offset
Effective input
resistance (TS) (1)
1
mV
8
Mâ¦
Z(ADC2)
Ilkg(ADC)
Effective input
resistance (BAT) (1)
Input leakage current (1)
bq28550-R1 is not measuring cell voltage.
bq28550-R1 is measuring cell voltage.
8
Mâ¦
100
kâ¦
0.3
µA
(1) Specified by design. Not production tested.
6.13 Electrical Characteristics: Data Flash Memory Characteristics
TA = â40 to +85ºC, VBAT = 2.7 V to 5.5 V; Typical values stated, where TA = 25ºC and VBAT = 3.6 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Data retention (1)
10
Years
tDR
Flash programming
write-cycles (1)
20,000
Cycles
tWORDPROG
Word programming time
(1)
2
ms
ICCPROG
Flash-write supply
current (1)
5
10
mA
(1) Specified by design. Not production tested.
6.14 Electrical Characteristics: Serial Communication Timing Characteristics
TA = â40 to +85ºC, VBAT = 2.7 V to 5.5 V; Typical values stated, where TA = 25ºC and VBAT = 3.6 V (unless otherwise noted).
Capacitance on serial interface pins SCL and SDA are 10 pF unless otherwise specified (1).
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
tr
tf
tw(H)
tw(L)
tsu(STA)
td(STA)
SCL/SDA rise time
SCL/SDA fall time
SCL pulse width (high)
SCL pulse width (low)
Setup for repeated start
Start to first falling edge
of SCL
300
ns
300
ns
600
ns
1.3
μs
600
ns
600
ns
tsu(DAT)
th(DAT)
Data setup time
Data hold time
1
μs
0
ns
(1) Parameters assured by worst case test program execution in fast mode.
8
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