LMH6624_16 Datasheet, PDF (7/38 Pages) Texas Instruments – LMH6624 and LMH6626 Single/Dual Ultra Low Noise Wideband Operational Amplifier

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LMH6624, LMH6626
SNOSA42G – NOVEMBER 2002 – REVISED DECEMBER 2014
6.6 Electrical Characteristics ±6 V
Unless otherwise specified, all limits ensured at T_A = 25°C, V⁺ = 6 V, V^− = −6 V, V_CM = 0 V, A_V = +20, R_F = 500 Ω,
R_L = 100 Ω. See ⁽¹⁾.
PARAMETER
TEST CONDITIONS
MIN ⁽²⁾ TYP ⁽³⁾ MAX⁽²⁾
UNIT
DYNAMIC PERFORMANCE
f_CL
−3dB BW
V_O = 400 mV_PP (LMH6624)
V_O = 400 mV_PP (LMH6626)
V_O = 2 V_PP, A_V = +20 (LMH6624)
SR
Slew rate⁽⁴⁾
V_O = 2 V_PP, A_V = +20 (LMH6626)
V_O = 2 V_PP, A_V = +10 (LMH6624)
V_O = 2 V_PP, A_V = +10 (LMH6626)
t_r
Rise time
V_O = 400 mV Step, 10% to 90%
t_f
Fall time
V_O = 400 mV Step, 10% to 90%
t_s
Settling time 0.1%
V_O = 2 V_PP (Step)
DISTORTION and NOISE RESPONSE
95
MHz
85
350
320
V/μs
400
360
3.7
ns
3.7
ns
18
ns
f = 1 MHz (LMH6624)
e_n
Input referred voltage noise
f = 1 MHz (LMH6626)
0.92
nV/√Hz
1.0
i_n
Input referred current noise
HD2
HD3
2^nd harmonic distortion
3^rd harmonic distortion
INPUT CHARACTERISTICS
f = 1 MHz (LMH6624)
f = 1 MHz (LMH6626)
f_C = 10 MHz, V_O = 1 V_PP, R_L = 100 Ω
f_C = 10 MHz, V_O = 1 V_PP, R_L = 100 Ω
2.3
pA/√Hz
1.8
−63
dBc
−80
dBc
Input offset voltage
V_OS
Average drift⁽⁵⁾
Input offset current
I_OS
Average drift⁽⁵⁾
Input bias current
I_B
Average drift⁽⁵⁾
R_IN
Input resistance⁽⁶⁾
V_CM = 0 V
V_CM = 0 V
(LMH6624)
V_CM = 0 V
(LMH6626)
V_CM = 0 V
V_CM = 0 V
V_CM = 0 V
V_CM = 0 V
Common Mode
Differential Mode
-40°C ≤ T_J ≤ 125°C
-40°C ≤ T_J ≤ 125°C
-40°C ≤ T_J ≤ 125°C
-40°C ≤ T_J ≤ 125°C
−0.5
−0.7
−1.1
−2.5
−2.0
−2.5
±0.10
±0.2
0.05
0.1
0.7
13
12
6.6
4.6
+0.5
+0.7
1.1
2.5
2.0
2.5
+20
+25
mV
μV/°C
μA
nA/°C
μA
nA/°C
MΩ
kΩ
C_IN
Input capacitance⁽⁶⁾
Common Mode
Differential Mode
0.9
pF
2.0
CMRR
Common mode rejection
ratio
Input Referred, V_CM = −4.5 to +5.25 V
Input Referred,
V_CM = −4.5 to +5.0 V
-40°C ≤ T_J ≤ 125°C
90
95
87
dB
(1) Electrical table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T_J = T_A. No ensured specification of parametric performance is indicated in the electrical
tables under conditions of internal self-heating where T_J > T_A. Absolute maximum ratings indicate junction temperature limits beyond
which the device may be permanently degraded, either mechanically or electrically.
(2) All limits are specified by testing or statistical analysis.
(3) Typical Values represent the most likely parametric norm.
(4) Slew rate is the slowest of the rising and falling slew rates.
(5) Average drift is determined by dividing the change in parameter at temperature extremes into the total temperature change.
(6) Simulation results.
Copyright © 2002–2014, Texas Instruments Incorporated
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