LMH6551 Datasheet, PDF (7/32 Pages) National Semiconductor (TI) – Differential, High Speed Op Amp

www.ti.com
LMH6551
SNOSAK7D – FEBRUARY 2005 – REVISED JANUARY 2015
Electrical Characteristics: 5 V⁽¹⁾ (continued)
Single-ended in differential out, T_A= 25°C, G = +1, V_S = 5 V, V_CM = 2.5 V, R_F = R_G = 365 Ω, R_L = 500 Ω; unless specified.
PARAMETER
TEST CONDITIONS
MIN ⁽²⁾ TYP ⁽³⁾ MAX ⁽²⁾ UNIT
Common-Mode Gain
OUTPUT PERFORMANCE
ΔV_O,CM/ΔV_CM
0.995 0.991
1.005 V/V
V_OUT
Output Voltage Swing
Single-Ended, Peak to Peak, V_S= ±2.5
±2.4
±2.8
V
V, V_CM= 0 V
I_OUT
Linear Output Current
V_OUT = 0-V Differential
±45
±60
mA
I_SC
Output Short Circuit Current
Output Shorted to Ground
V_IN = 3-V Single-Ended⁽⁷⁾
230
mA
CMVR
Output Common-Mode Voltage
Range
V_ID = 0, V_CMpin = 1.2 V and 3.8 V
3.72
3.8
1.23
1.2
V
Output Balance Error
ΔV_OUTCommon Mode
/ΔV_OUTDIfferential, V_OUT = 1Vpp
Differential, f = 10 MHz
−65
dB
MISCELLANEOUS PERFORMANCE
Open Loop Gain
DC, Differential
70
dB
PSRR
I_S
Power Supply Rejection Ratio
Supply Current
DC, ΔV_S = ±0.5 V
R_L = ∞
At extreme
temperatures
72
88
10
11.5
dB
13.5 mA
15.5
(7) The maximum output current (I_OUT) is determined by device power dissipation limitations.
7.7 Electrical Characteristics: 3.3 V⁽¹⁾
Single-ended in differential out, T_A= 25°C, G = +1, V_S = 3.3 V, V_CM = 1.65 V, R_F = R_G = 365 Ω, R_L = 500 Ω; unless specified.
PARAMETER
TEST CONDITIONS
MIN ⁽²⁾ TYP ⁽³⁾ MAX ⁽²⁾ UNIT
SSBW
LSBW
Small Signal −3 dB Bandwidth
Large Signal −3 dB Bandwidth
Slew Rate
R_L = 500 Ω, V_OUT = 0.5 V_PP
R_L = 500 Ω, V_OUT = 1 V_PP
1-V Step⁽⁴⁾
320
MHz
300
MHz
700
V/μs
Rise/Fall Time, 10% to 90%
1-V Step
2
ns
V_CM PIN AC PERFORMANCE (COMMON-MODE FEEDBACK AMPLIFIER)
Common-Mode Small Signal
Bandwidth
95
MHz
DISTORTION AND NOISE RESPONSE
HD2
2^nd Harmonic Distortion
HD2
HD3
3^rd Harmonic Distortion
HD3
V_O = 1 V_PP, f = 5 MHz, R_L=800 Ω
V_O = 1 V_PP, f = 20 MHz, R_L=800 Ω
V_O = 1 V_PP, f = 5 MHz, R_L=800 Ω
V_O = 1 V_PP, f = 20 MHz, R_L=800 Ω
−93
dBc
−74
dBc
−85
dBc
−69
dBc
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T_J = T_A. No specification of parametric performance is indicated in the electrical tables under
conditions of internal self-heating where T_J > T_A.
(2) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlation using
Statistical Quality Control (SQC) methods.
(3) Typical numbers are the most likely parametric norm.
(4) Slew Rate is the average of the rising and falling edges.
Copyright © 2005–2015, Texas Instruments Incorporated
Product Folder Links: LMH6551
Submit Documentation Feedback
7