LMH6551 Datasheet, PDF (6/32 Pages) National Semiconductor (TI) – Differential, High Speed Op Amp

LMH6551
SNOSAK7D – FEBRUARY 2005 – REVISED JANUARY 2015
www.ti.com
7.6 Electrical Characteristics: 5 V⁽¹⁾
Single-ended in differential out, T_A= 25°C, G = +1, V_S = 5 V, V_CM = 2.5 V, R_F = R_G = 365 Ω, R_L = 500 Ω; unless specified.
PARAMETER
TEST CONDITIONS
MIN ⁽²⁾ TYP ⁽³⁾ MAX ⁽²⁾ UNIT
SSBW
LSBW
Small Signal −3 dB Bandwidth
Large Signal −3 dB Bandwidth
0.1 dB Bandwidth
Slew Rate
R_L = 500 Ω, V_OUT = 0.5 V_PP
R_L = 500 Ω, V_OUT = 2 V_PP
V_OUT = 2 V_PP
4-V Step⁽⁴⁾
350
300
50
1800
MHz
MHz
MHz
V/μs
Rise/Fall Time, 10% to 90%
4-V Step
2
ns
Settling Time
4-V Step, 0.05%
17
ns
V_CM PIN AC PERFORMANCE (COMMON-MODE FEEDBACK AMPLIFIER)
Common-Mode Small Signal
Bandwidth
170
MHz
DISTORTION AND NOISE RESPONSE
HD2
2^nd Harmonic Distortion
HD2
HD3
3^rd Harmonic Distortion
HD3
e_n
Input Referred Noise Voltage
i_n
Input Referred Noise Current
INPUT CHARACTERISTICS (DIFFERENTIAL)
V_O = 2 V_PP, f = 5 MHz, R_L=800 Ω
V_O = 2 V_PP, f = 20 MHz, R_L=800 Ω
V_O = 2 V_PP, f = 5 MHz, R_L=800 Ω
V_O = 2 V_PP, f = 20 MHz, R_L=800 Ω
Freq ≥ 1 MHz
Freq ≥ 1 MHz
−84
dBc
−69
dBc
−93
dBc
−67
dBc
6.0
nV/√Hz
1.5
pA/√Hz
V_OSD
Input Offset Voltage
Differential Mode, V_ID =
0, V_CM = 0
At extreme
temperatures
0.5
±4 mV
±6
I_BIAS
Input Offset Voltage Average
Temperature Drift⁽⁵⁾
Input Bias Current⁽⁶⁾
−0.8
−4
µV/°C
0
μA
-10
Input Bias Current Average
Temperature Drift⁽⁵⁾
−3
nA/°C
Input Bias Current Difference
Difference in Bias currents between the
two inputs
0.03
µA
CMRR
Common-Mode Rejection Ratio
Input Resistance
DC, V_ID = 0 V
Differential
70
78
dBc
5
MΩ
Input Capacitance
Differential
1
pF
V_ICM
Input Common-Mode Range
CMRR > 53 dB
+3.1
+3.2
+0.4
+0.3
V_CMPIN INPUT CHARACTERISTICS (COMMON-MODE FEEDBACK AMPLIFIER)
Input Offset Voltage
Common Mode, V_ID =
0
At extreme
temperatures
0.5
±5 mV
±8
Input Offset Voltage Average
Temperature Drift
5.8
µV/°C
Input Bias Current
3
μA
V_CM CMRR
Input Resistance
V_ID = 0,
70
75
dB
1V step on V_CM pin, measure V_OD
V_CM pin to ground
25
kΩ
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T_J = T_A. No specification of parametric performance is indicated in the electrical tables under
conditions of internal self-heating where T_J > T_A.
(2) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlation using
Statistical Quality Control (SQC) methods.
(3) Typical numbers are the most likely parametric norm.
(4) Slew Rate is the average of the rising and falling edges.
(5) Drift determined by dividing the change in parameter at temperature extremes by the total temperature change.
(6) Negative input current implies current flowing out of the device.
6
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