LMH6551 Datasheet, PDF (4/32 Pages) National Semiconductor (TI) – Differential, High Speed Op Amp

LMH6551
SNOSAK7D – FEBRUARY 2005 – REVISED JANUARY 2015
7.3 Recommended Operating Conditions
Operating Temperature Range
Total Supply Voltage
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MIN
NOM
MAX UNIT
−40
+125
°C
3
12
V
7.4 Thermal Information
THERMAL METRIC⁽¹⁾
LMH6551
D
DGK
UNIT
R_θJA
Junction-to-ambient thermal resistance ⁽²⁾
8 PINS
150
8 PINS
235
°C/W
(1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
(2) The maximum power dissipation is a function of T_J(MAX), θ_JA and T_A. The maximum allowable power dissipation at any ambient
temperature is P _D= (T_J(MAX) — T_A)/ θ_JA. All numbers apply for package soldered directly into a 2 layer PC board with zero air flow.
7.5 Electrical Characteristics: ±5 V⁽¹⁾
Single-ended in differential out, T_A= 25°C, G = +1, V_S = ±5 V, V_CM = 0 V, R_F = R_G = 365 Ω, R_L = 500 Ω; unless specified.
PARAMETER
TEST CONDITIONS
MIN ⁽²⁾ TYP ⁽³⁾ MAX ⁽²⁾ UNIT
AC PERFORMANCE (DIFFERENTIAL)
SSBW
LSBW
Small Signal −3 dB Bandwidth
Large Signal −3 dB Bandwidth
Large Signal −3 dB Bandwidth
0.1 dB Bandwidth
Slew Rate
V_OUT = 0.5 V_PP
V_OUT = 2 V_PP
V_OUT = 4 V_PP
V_OUT = 2 V_PP
4-V Step⁽⁴⁾
370
340
320
50
2400
MHz
MHz
MHz
MHz
V/μs
Rise/Fall Time
2-V Step
1.8
ns
Settling Time
2-V Step, 0.05%
18
ns
V_CM PIN AC PERFORMANCE (COMMON-MODE FEEDBACK AMPLIFIER)
Common-Mode Small Signal
Bandwidth
V_CMbypass capacitor removed
200
MHz
DISTORTION AND NOISE RESPONSE
HD2
HD2
HD3
HD3
e_n
Input Referred Voltage Noise
i_n
Input Referred Noise Current
INPUT CHARACTERISTICS (DIFFERENTIAL)
V_O = 2 V_PP, f = 5 MHz, R_L=800 Ω
V_O = 2 V_PP, f = 20MHz, R_L=800 Ω
V_O = 2 V_PP, f = 5 MHz, R_L=800 Ω
V_O = 2 V_PP, f = 20 MHz, R_L=800 Ω
Freq ≥ 1 MHz
Freq ≥ 1 MHz
−94
dBc
−85
dBc
−96
dBc
−72
dBc
6.0
nV/√Hz
1.5
pA/√Hz
V_OSD
Input Offset Voltage
Differential Mode, V_ID
= 0, V_CM = 0
At extreme
temperatures
0.5
±4 mV
±6
Input Offset Voltage Average
Temperature Drift⁽⁵⁾
I_BI
Input Bias Current⁽⁶⁾
−0.8
µV/°C
-4
0 µA
-10
Input Bias Current Average
Temperature Drift⁽⁵⁾
−2.6
nA/°C
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T_J = T_A. No specification of parametric performance is indicated in the electrical tables under
conditions of internal self-heating where T_J > T_A.
(2) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlation using
Statistical Quality Control (SQC) methods.
(3) Typical numbers are the most likely parametric norm.
(4) Slew Rate is the average of the rising and falling edges.
(5) Drift determined by dividing the change in parameter at temperature extremes by the total temperature change.
(6) Negative input current implies current flowing out of the device.
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