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LMH2120 Datasheet, PDF (5/34 Pages) National Semiconductor (TI) – Linear RMS power detector particularly suited for accurate
LMH2120
www.ti.com
SNWS021C – JULY 2010 – REVISED FEBRUARY 2013
2.7 V and 4.5V DC and AC Electrical Characteristics (continued)
Unless otherwise specified, all limits are ensured to TA = 25°C, VDD = 2.7V and 4.5V (worst case of the 2 is specified), RFIN=
1900 MHz CW (Continuous Wave, unmodulated). Boldface limits apply at the temperature extremes (1).
Symbol
Parameter
Condition
Min
Typ
Max
Units
(2)
(3)
(2)
DR
Dynamic Range for specified
±1 dB Lin Conformance Error (ELC)
Accuracy
±3 dB Lin Conformance Error (ELC)
EMOD
Input referred Variation due to
Modulation
RFIN = 2600 MHz(5)
PMIN
Minimum Power Level, bottom
end of Dynamic Range
±0.5 dB Variation over Temperature
(EVOT)
±0.3 dB Error for a 1dB Power Step
(E1dB)
±1 dB Error for a 10dB Power Step
(E10dB)
W-CDMA Release 6/7/8,
-34 dBm<RFIN<-2 dBm
LTE, -34 dBm<RFIN<-2 dBm
Lin Conformance Error within ±1 dB
PMAX
Maximum Power Level, top end of
Dynamic Range
VMIN
VMAX
KSLOPE
PINT
DR
Minimum Output Voltage
Maximum Output Voltage
Linear Slope
Linear Intercept
Dynamic Range for specified
Accuracy
At PMIN
At PMAX
VOUT = 0 dBV
±1 dB Lin Conformance Error (ELC)
±3 dB Lin Conformance Error (ELC)
RFIN = 3500 MHz(6)
PMIN
Minimum Power Level, bottom
end of Dynamic Range
±0.5 dB Variation over Temperature
(EVOT)
Lin Conformance Error within ±1 dB
PMAX
Maximum Power Level, top end of
Dynamic Range
VMIN
VMAX
KSLOPE
PINT
DR
Minimum Output Voltage
Maximum Output Voltage
Linear Slope
Linear Intercept
Dynamic Range for specified
Accuracy
At PMIN
At PMAX
VOUT = 0 dBV
±1 dB Lin Conformance Error (ELC)
±3 dB Lin Conformance Error (ELC)
±0.5 dB Variation over Temperature
(EVOT)
35
38
31
35
44
48
41
45
35
40
dB
39
36
35
0.16
dB
0.24
-30
dBm
6
31
mV
1.5
V
1
dB/dB
0.8
1.7
2.6
dBm
32
36
29
33
43
45
40
42
dB
34
39
-26
dBm
7
32
mV
1.1
V
1
dB/dB
4.4
5.5
6.7
dBm
30
33
27
30
39
42
36
40
dB
27
35
(6) Limits are ensured by design and measurements which are performed on a limited number of samples.
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