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| BQ27541-V200_17 Datasheet, PDF (5/46 Pages) Texas Instruments – Single Cell Li-Ion Battery Fuel Gauge for Battery Pack Integration | |||
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Not Recommended for New Designs
bq27541-V200
www.ti.com
SLUSA11B â FEBRUARY 2010 â REVISED SEPTEMBER 2013
LOW FREQUENCY OSCILLATOR
TA = â40°C to 85°C, C(REG) = 0.47μF, 2.45 V < V(REGIN) = VBAT < 5.5 V; typical values at TA = 25°C and V(REGIN) = VBAT = 3.6 V
(unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP MAX UNIT
f(LOSC)
f(LEIO)
t(LSXO)
Operating frequency
Frequency error(1) (2)
Start-up time(3)
TA = 0°C to 60°C
TA = â20°C to 70°C
TA = â40°C to 85°C
32.768
KHz
â1.5% 0.25% 1.5%
â2.5% 0.25% 2.5%
-4.0% 0.25% 4.0%
500
μs
(1) The frequency drift is included and measured from the trimmed frequency at VCC = 2.5 V, TA = 25°C.
(2) The frequency error is measured from 32.768 KHz.
(3) The startup time is defined as the time it takes for the oscillator output frequency to be ±3% of typical oscillator frequency.
INTEGRATING ADC (COULOMB COUNTER) CHARACTERISTICS
TA = â40°C to 85°C, C(REG) = 0.47μF, 2.45 V < V(REGIN) = VBAT < 5.5 V; typical values at TA = 25°C and V(REGIN) = VBAT = 3.6 V
(unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP MAX UNIT
VIN(SR)
tCONV(SR)
Input voltage range, V(SRN) and V(SRP)
Conversion time
Resolution
VSR = V(SRN) â V(SRP)
Single conversion
â0.125
14
0.125 V
1
s
15 bits
VOS(SR)
INL
ZIN(SR)
Ilkg(SR)
Input offset
Integral nonlinearity error
Effective input resistance(1)
Input leakage current(1)
10
μV
±0.007 ±0.034 FSR
2.5
Mâ¦
0.3 μA
(1) Specified by design. Not production tested.
ADC (TEMPERATURE AND CELL VOLTAGE) CHARACTERISTICS
TA = â40°C to 85°C, C(REG) = 0.47μF, 2.45 V < V(REGIN) = VBAT < 5.5 V; typical values at TA = 25°C and V(REGIN) = VBAT = 3.6 V
(unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN TYP MAX UNIT
VIN(ADC)
tCONV(ADC)
Input voltage range
Conversion time
Resolution
â0.2
1V
125 ms
14
15 bits
VOS(ADC)
Z(ADC1)
Z(ADC2)
Ilkg(ADC)
Input offset
Effective input resistance (TS) (1)
Effective input resistance (BAT)(1)
Input leakage current(1)
bq27541 not measuring cell voltage
bq27541 measuring cell voltage
1
8
8
100
mV
Mâ¦
Mâ¦
kâ¦
0.3 μA
(1) Specified by design. Not production tested.
DATA FLASH MEMORY CHARACTERISTICS
TA = â40°C to 85°C, C(REG) = 0.47μF, 2.45 V < V(REGIN) = VBAT < 5.5 V; typical values at TA = 25°C and V(REGIN) = VBAT = 3.6 V
(unless otherwise noted)
tDR
tWORDPROG
ICCPROG
PARAMETER
Data retention(1)
Flash programming write-cycles (1)
Word programming time(1)
Flash-write supply current(1)
TEST CONDITIONS
MIN
10
20,000
TYP MAX UNIT
Years
Cycles
2 ms
5
10 mA
(1) Specified by design. Not production tested.
Copyright © 2010â2013, Texas Instruments Incorporated
Product Folder Links: bq27541-V200
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