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| BQ27425-G1 Datasheet, PDF (5/32 Pages) Texas Instruments – System-Side Impedance Track™ Fuel Gauge With Integrated Sense Resistor | |||
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bq27425-G1
www.ti.com
INTERNAL TEMPERATURE SENSOR CHARACTERISTICS
TA = â40°C to 85°C; typical values at TA = 25°C and VREGIN = 3.6 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
GTEMP
Temperature sensor voltage gain
SLUSAI6 â NOVEMBER 2011
TYP MAX UNIT
â2
mV/°C
INTEGRATING ADC (COULOMB COUNTER) CHARACTERISTICS
TA = â40°C to 85°C; typical values at TA = 25°C and VREGIN = 3.6 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN TYP
VSR
Input voltage range (1)(2)
VSR = V(SRX) â VSS
â0.040
tSR_CONV
Conversion time
Single conversion
1
Resolution
14
VOS(SR)
INL
ZIN(SR)
Ilkg(SR)
Input offset
Integral nonlinearity error
Effective input resistance(1)
Input leakage current(1)
TA = 25°C
10
±0.007
2.5
(1) Specified by design. Not tested in production.
(2) Limited by ISRX maximum recommend input current with some margin for the Integrated Sense Resistor tolerance.
MAX
0.040
15
±0.034
0.3
UNIT
V
s
bits
μV
% FSR
Mâ¦
μA
INTEGRATED SENSE RESISTOR CHARACTERISTICS
TA = â40°C to 85°C; typical values at TA = 25°C and VREGIN = 3.6 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN TYP
SRXRES
Resistance of Integrated Sense Resistor from SRX TA = 25°C
10
to VSS.(1)(2)
ISRX
Recommended Sense Resistor input current.(1)(3) Long term RMS, average
device utilization.
Peak RMS current, 10%
device utilization.(3)
Peak pulsed current, 250mS
max, 1% device utilization.(3)
(1) Specified by design. Not tested in production.
(2) Firmware compensation applied for temperature coefficient of resistor.
(3) Device utilization is the long term usage profile at a specific condition compared to the average condition.
MAX UNIT
mâ¦
1000 mA
2500 mA
3500 mA
ADC (TEMPERATURE AND CELL MEASUREMENT) CHARACTERISTICS
TA = â40°C to 85°C; typical values at TA = 25°C and VREGIN = 3.6 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
VIN(ADC)
tADC_CONV
Input voltage range
Conversion time
Resolution
VOS(ADC)
ZADC
Ilkg(ADC)
Input offset
Effective input resistance (BAT)(1)
Input leakage current(1)
Not measuring cell voltage
Measuring cell voltage
TA = 25°C
MIN
0.05
14
8
(1) Specified by design. Not tested in production.
TYP MAX
1
125
15
1
100
0.3
UNIT
V
ms
bits
mV
Mâ¦
kâ¦
μA
Copyright © 2011, Texas Instruments Incorporated
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