RM48L940_15 Datasheet, PDF (40/172 Pages) Texas Instruments – RM48Lx40 16- and 32-Bit RISC Flash Microcontroller

RM48L940, RM48L740, RM48L540
SPNS175C – APRIL 2012 – REVISED JUNE 2015
www.ti.com
5 Specifications
5.1 Absolute Maximum Ratings ⁽¹⁾
Over Operating Free-Air Temperature Range
Supply voltage
Input voltage
V_CC ⁽²⁾
V_CCIO, V_CCP ⁽²⁾
V_CCAD
All input pins
ADC input pins
MIN
MAX UNIT
–0.3
1.43
–0.3
4.6
V
–0.3
6.25
–0.3
4.6
V
–0.3
6.25
Input clamp current
I_IK (V_I < 0 or V_I > V_CCIO)
All pins, except AD1IN[23:0] and AD2IN[15:0]
I_IK (V_I < 0 or V_I > V_CCAD)
AD1IN[23:0] and AD2IN[15:0]
–20
20
mA
–10
10
Total
–40
40 mA
Operating free-air temperature, T_A:
Operating junction temperature, T_J:
Storage temperature, T_stg
–40
105
°C
–40
130
°C
–65
150
°C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) Maximum-rated conditions for extended periods may affect device reliability. All voltage values are with respect to their associated
grounds.
5.2 ESD Ratings
Human body model (HBM), per ANSI/ESDA/JEDEC JS001⁽¹⁾
V_ESD Electrostatic discharge (ESD) performance: _{Charged device model (CDM), per JESD22-C101(2) All pins}
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
VALUE
±2
±250
UNIT
kV
V
5.3 Power-On Hours (POH)⁽¹⁾⁽²⁾
NOMINAL CORE VOLTAGE (V_CC)
1.2
JUNCTION
TEMPERATURE (Tj)
105ºC
LIFETIME POH
100K
(1) This information is provided solely for your convenience and does not extend or modify the warranty provided under TI's standard terms
and conditions for TI semiconductor products.
(2) To avoid significant degradation, the device power-on hours (POH) must be limited to those specified in this table. To convert to
equivalent POH for a specific temperature profile, see the Calculating Equivalent Power-on-Hours for Hercules Safety MCUs Application
Report (SPNA207).
40
Specifications
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