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LM3424 Datasheet, PDF (4/69 Pages) National Semiconductor (TI) – Constant Current N-Channel Controller with Thermal Foldback for Driving LEDs
LM3424, LM3424-Q1
SNVS603C – AUGUST 2009 – REVISED AUGUST 2015
www.ti.com
6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)(2)
Voltage
VIN, EN, nDIM
OVP, HSP, HSN
IS
VCC
VS, TREF, TSENSE, TGAIN, COMP, CSH,
RT, SLOPE, SS
GATE, DDRV
GND
VIN, EN, nDIM
OVP, HSP, HSN
Continuous current
IS
SS
GATE, DDRV
Continuous power dissipation
Maximum Junction Temperature
Maximum lead temperature (Reflow and Solder)(3)
Storage temperature
MIN
MAX
–0.3
76
–0.3
76
–0.3
76
–2 for 100 ns
–0.3
8
–0.3
6
–0.3
–2.5 for 100 ns
–0.3
VCC
VCC + 2.5 for 100 ns
0.3
–2.5 for 100 ns
2.5 for 100 ns
–1
–100
–1
–30
30
–1
1
Internally Limited
Internally Limited
260
–65
150
UNIT
V
mA
µA
mA
µA
mA
°C
°C
°C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/Distributors for availability and
specifications.
(3) Refer toTI’s packaging website for more detailed information and mounting techniques. http://www.ti.com/analogpackaging
6.2 ESD Ratings—LM3424
V(ESD)
Electrostatic
discharge
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins(1)
Charged device model (CDM), per JEDEC specification JESD22-C101, all
pins (2)
VALUE
±2500
±1000
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
UNIT
V
6.3 ESD Ratings—LM3424-Q1
V(ESD)
Electrostatic
discharge
Human-body model (HBM), per AEC Q100-002(1)
Charged-device model (CDM), per AEC Q100-011
VALUE
±2500
±1000
(1) AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
UNIT
V
6.4 Recommended Operating Conditions
Operating Ambient Temperature Range
Input Voltage VIN
MIN
MAX UNIT
–40
125 °C
4.5
75 V
4
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