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LM3880_14 Datasheet, PDF (3/20 Pages) Texas Instruments – Power Sequencer
LM3880, LM3880Q
www.ti.com
SNVS451H – AUGUST 2006 – REVISED JULY 2011
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
Absolute Maximum Ratings (1)
VCC
EN, FLAG1, FLAG2, FLAG3
Max Flag 'ON' Current
Storage Temperature Range
Junction Temperature
Lead Temperature (Soldering, 5 sec.)
Minimum ESD Rating
−0.3V to +6.0V
−0.3V to 6.0V
50 mA
−65°C to +150°C
150°C
260°C
±2 kV
(1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is intended to be functional, but does not guarantee specific performance limits. For guaranteed specifications and
conditions, see the Electrical Characteristics.
Operating Ratings (1)
VCC to GND
EN, FLAG1, FLAG2, FLAG3
Junction Temperature
2.7V to 5.5V
−0.3V to VCC + 0.3V
−40°C to +125°C
(1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is intended to be functional, but does not guarantee specific performance limits. For guaranteed specifications and
conditions, see the Electrical Characteristics.
Copyright © 2006–2011, Texas Instruments Incorporated
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