DS90LV031AQML_14 Datasheet, PDF (3/15 Pages) Texas Instruments – 3V LVDS Quad CMOS Differential Line Driver

DS90LV031AQML
www.ti.com
SNLS204A – NOVEMBER 2011 – REVISED APRIL 2013
Absolute Maximum Ratings ⁽¹⁾
Supply Voltage (V_CC)
Input Voltage (D_I)
Enable Input Voltage (En, En*)
Output Voltage (D_O+, D_O−)
Storage Temperature Range
Lead Temperature Range (Soldering 4 sec.)
Maximum Junction Temperature
Maximum Power Dissipation @ +25°C ⁽²⁾
16LD CLGA (NAC and NAD)
Thermal Resistance
θ_JA
16LD CLGA (NAC and NAD)
θ_JC
16LD CLGA (NAC and NAD)
ESD Rating ⁽³⁾
−0.3V to +4V
−0.3V to (V_CC + 0.3V)
−0.3V to (V_CC + 0.3V)
−0.3V to +3.9V
−65°C ≤ T_A ≤ +150°C
+260°C
+150°C
845mW
148°C/W
22°C/W
6KV
(1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the
Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may
degrade when the device is not operated under the listed test conditions.
(2) Derate (NAD & NAC packages) at 6.8mW/°C for temperatures above +25°C.
(3) Human body model, 1.5 kΩ in series with 100 pF
Recommended Operating Conditions
Supply Voltage (V_CC)
Operating Free Air Temperature (T_A)
Min
+3.0V
-55°C
Typ
+3.3V
+25°C
Max
+3.6V
+125°C
Table 1. Quality Conformance InspectionMil-Std-883, Method 5005 - Group A
Subgroup
1
2
3
4
5
6
7
8A
8B
9
10
11
12
13
14
Description
Static tests at
Static tests at
Static tests at
Dynamic tests at
Dynamic tests at
Dynamic tests at
Functional tests at
Functional tests at
Functional tests at
Switching tests at
Switching tests at
Switching tests at
Settling time at
Settling time at
Settling time at
Temp °C
+25
+125
-55
+25
+125
-55
+25
+125
-55
+25
+125
-55
+25
+125
-55
Copyright © 2011–2013, Texas Instruments Incorporated
Product Folder Links: DS90LV031AQML
Submit Documentation Feedback
3