BQ34210-Q1 Datasheet, PDF (3/19 Pages) Texas Instruments – Automotive 1-Series Cell System-Side CEDV Fuel Gauge for Rarely Discharged Batteries

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5 Pin Configuration and Functions
bq34210-Q1
SLUSCG1 – AUGUST 2017
SDA
1
SCL
2
VSS
3
NC
4
REG18
5
NC
6
REGIN
7
14
ALERT
13
NC
12
TS
11
NC
10
SRP
9
SRN
8
NC
Not to scale
NUMBER
1
2
3
5
7
9
10
12
14
4, 6, 8,
11, 13
NAME
SDA
SCL
VSS
REG18
REGIN
SRN
SRP
TS
ALERT
NC
TYPE
IO ⁽¹⁾
IO
P
P
P
AI
AI
AI
IO
NC
Pin Functions
DESCRIPTION
Open drain slave I²C serial communication data line. Use with a 10-kΩ pullup resistor (typical).
Slave I²C serial communication clock input. Use with a 10-kΩ pullup resistor (typical).
Device ground
Capacitor required for the 1.8-V integrated LDO. Decouple with 2.2-µF ceramic capacitor to VSS.
Battery voltage input and integrated LDO input. Decouple with 1-µF ceramic capacitor to VSS.
Analog input pin connected to the internal coulomb-counter peripheral for integrating a small voltage between
SRP and SRN where the voltage at SRN will be lower than SRP during a charging event
Analog input pin connected to the internal coulomb-counter peripheral for integrating a small voltage between
SRP and SRN where the voltage at SRP will be higher than SRN during a charging event
Pack thermistor voltage sense (use 103AT-type thermistor). Disable TS with a 10-kΩ resistor to VSS. Do not
leave floating.
Open drain ALERT output, requires a pullup resistor (typical 10 kΩ). Used as an input to exit SHUTDOWN mode
No internal connection
(1) IO = Digital input-output, AI = Analog input, P = Power connection, NC = No internal connection
6 Specifications
6.1 Absolute Maximum Ratings
Over operating free-air temperature range (unless otherwise noted)⁽¹⁾
V_REGIN
REGIN pin input voltage range
V_SR
V_REG18
V_IOD
V_ALERT
SRP and SRN pins input voltage range
Differential voltage across SRP and SRN. ABS(SRP – SRN)
REG18 LDO output for capacitor only (not a supply pin)
Open-drain IO pins (SDA, SCL)
Open Drain Output / Control Input (ALERT)
V_AI
TS
T_A
Operating free-air temperature range
Storage temperature, T_stg
MIN
–0.3
–0.3
–0.3
–0.3
–0.3
–0.3
–0.3
–40
–65
MAX
6
V_REGIN +
0.3
2
2
6
6
REG18 +
0.3
85
150
UNIT
V
V
V
V
V
V
V
°C
°C
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
Copyright © 2017, Texas Instruments Incorporated
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