TLK2201B_13 Datasheet, PDF (2/24 Pages) Texas Instruments – ETHERNET TRANSCEIVERS

TLK2201B
TLK2201BI
SLLS585C – NOVEMBER 2003 – REVISED FEBRUARY 2008
www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
DESCRIPTION (CONTINUED)
The primary application of these devices is to provide building blocks for point-to-point baseband data
transmission over controlled impedance media of 50 Ω or 75 Ω. The transmission media can be printed-circuit
board traces, copper cables or fiber-optical media. The ultimate rate and distance of data transfer is dependent
upon the attenuation characteristics of the media and the noise coupling to the environment.
The TLK2201B and TLK2201BI perform the data serialization, deserialization, and clock extraction functions for a
physical layer interface device. The transceiver operates at 1.25 Gbps (typical), providing up to 1 Gbps of data
bandwidth over a copper or optical media interface.
The TLK2201B and TLK2201BI support both the defined 10-bit interface (TBI) and a reduced 5-bit interface
utilizing double data rate (DDR) clocking. In the TBI mode the serializer/deserializer (SERDES) accepts 10-bit
wide 8b/10b parallel encoded data bytes. The parallel data bytes are serialized and transmitted differentially at
PECL compatible voltage levels. The SERDES extracts clock information from the input serial stream and
deserializes the data, outputting a parallel 10-bit data byte.
In the DDR mode the parallel interface accepts 5-bit wide 8b/10b encoded data aligned to both the rising and
falling edge of the reference clock. The data is clocked most significant bit first, (bits 0–4 of the 8b/10b encoded
data) on the rising edge of the clock and the least significant bits (bits 5–9 of the 8b/10b encoded data) are
clocked on the falling edge of the clock.
The TLK2201B and TLK2201BI provide a comprehensive series of built-in tests for self-test purposes including
loopback and pseudorandom binary sequence (PRBS) generation and verification. An IEEE 1149.1 JTAG port is
also supported.
The TLK2201B and TLK2201BI are housed in a high performance, thermally enhanced, 64-pin VQFP PowerPAD
package. Use of the PowerPAD package does not require any special considerations except to note that the
PowerPAD, which is an exposed die pad on the bottom of the device, is a metallic thermal and electrical
conductor. It is recommended that the TLK2201B and TLK2201BI PowerPADs be soldered to the thermal land
on the board.
The TLK2201B is characterized for operation from 0°C to 70°C. The TLK2201BI is characterized for operation
from –40°C to 85°C.
The TLK2201B and TLK2201BI use a 2.5-V supply. The I/O section is 3.3-V compatible. With the 2.5-V supply
the chipset is very power-efficient, dissipating less than 200 mW typical power when operating at 1.25 Gbps.
The TLK2201B and TLK2201BI are designed to be hot plug capable. A power-on reset causes RBC0, RBC1, the
parallel output signal terminals, TXP, and TXN to be held in high-impedance state.
Differences Between TLK2201B, TLK2201BI, and TNETE2201
The TLK2201B and TLK2201BI are the functional equivalent of the TNETE2201. There are several differences
between the devices as noted below. Refer to Figure 12 in the application information section for an example of
a typical application circuit.
• The V_CC is 2.5 V for the TLK2201B and TLK2201BI vs 3.3 V for TNETE2201.
• The PLL filter capacitors on pins 16, 17, 48, and 49 of the TNETE2201 are no longer required. The
TLK2201B and TLK2201BI uses these pins to provide added test capabilities. The capacitors, if present, do
not affect the operation of the device.
• No pulldown resistors are required on the TXP/TXN outputs.
T_A
0°C to 70°C
–40°C to 85°C
AVAILABLE OPTIONS
PACKAGE
PLASTIC QUAD FLAT PACK (RCP)
TLK2201BRCP
TLK2201BIRCP
2
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