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OPA322-Q1 Datasheet, PDF (2/26 Pages) Texas Instruments – CMOS Operational Amplifier With Shutdown
OPA322-Q1, OPA322S-Q1
OPA2322-Q1, OPA2322S-Q1
OPA4322-Q1, OPA4322S-Q1
SLOS856A – JUNE 2013 – REVISED JUNE 2013
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ABSOLUTE MAXIMUM RATINGS(1)
Over operating free-air temperature range, unless otherwise noted.
OPA322-Q1, OPA322S-Q1, OPA2322-Q1,
OPA2322S-Q1, OPA4322-Q1, OPA4322S-Q1
Supply voltage, VS = (V+) – (V–)
Signal input pins
Voltage (2)
Current (2)
Output short-circuit current(3)
6
(V–) – 0.5 to (V+) + 0.5
±10
Continuous
Operating temperature, TA
Storage temperature, Tstg
Junction temperature, TJ
ESD ratings
Human-body model (HBM) AEC-Q100
Classification Level H3A
Charged-device model (CDM) AEC-Q100
Classification Level C5
–40 to 125
–65 to 150
150
4
1000
UNIT
V
V
mA
mA
°C
°C
°C
kV
V
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute-maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
(2) Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.5 V beyond the supply rails should
be current limited to 10 mA or less.
(3) Short-circuit to ground, one amplifier per package.
2
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Product Folder Links: OPA322-Q1 OPA322S-Q1 OPA2322-Q1 OPA2322S-Q1 OPA4322-Q1 OPA4322S-Q1