BUF20800-Q1 Datasheet, PDF (2/32 Pages) Texas Instruments – 18-CHANNEL GAMMA VOLTAGE GENERATOR WITH TWO PROGRAMMABLE VCOM CHANNELS

BUF20800-Q1
SBOS571 – AUGUST 2011
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PRODUCT
BUF20800-Q1
ORDERING INFORMATION⁽¹⁾
PACKAGE
PACKAGE DESIGNATOR
HTSSOP-38
DCP
PACKAGE MARKING
BUF20800Q
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
ABSOLUTE MAXIMUM RATINGS⁽¹⁾
over operating free-air temperature range (unless otherwise noted).
PARAMETER
V_S
Supply voltage
V_SD
Supply voltage
Signal input terminals, SCL, SDA, AO, LD
Voltage
Current
Output Short-Circuit⁽²⁾
T_A
Operating temperature
T_stg
Storage temperature
T_J
Junction temperature
Latch-up per JESD78B
VALUE
19
6
–0.5 to 6
±10
Continuous
–40 to +105
–65 to +150
125
Class 1
UNIT
V
V
V
mA
°C
°C
°C
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
(2) Short-circuit to ground, one channel at a time.
2
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