DS90C031QML Datasheet, PDF(14/20 Page) Texas Instruments – DS90C031QML LVDS Quad CMOS Differential Line Driver

English

English German Russian Spanish Italian Polish Chinese Japanese Korean French Portuguese	Language :

DS90C031QML Datasheet, PDF (14/20 Pages) Texas Instruments – DS90C031QML LVDS Quad CMOS Differential Line Driver

◁

Radiation Environments

Careful consideration should be given to environmental con-

ditions when using a product in a radiation environment.

Total Ionizing Dose

Radiation hardness assured (RHA) products are those part

numbers with a total ionizing dose (TID) level specified in the

Ordering Information table on the front page. Testing and

qualification of these products is done on a wafer level ac-

cording to MIL-STD-883G, Test Method 1019.7, Condition A

and the âExtended room temperature anneal testâ described

in section 3.11 for application environment dose rates less

than 0.16 rad(Si)/s. Wafer level TID data is available with lot

shipments.

Single Event Latch-Up

One time single event latch-up (SEL) testing was preformed

showing SEL immunity to 103 MeV-cm2/mg. A test report is

available upon request.

Single Event Upset

Single event upset (SEU) data are available upon request.

www.national.com

▷