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ADS8556 Datasheet, PDF (12/47 Pages) Texas Instruments – 16-14-12-Bit Six-Channel Simultaneous Sampling ANALOG-TO-DIGITAL CONVERTERS
ADS8556, ADS8557, ADS8558
SBAS404D – OCTOBER 2006 – REVISED FEBRUARY 2016
www.ti.com
6.7 Electrical Characteristics: ADS8557
over recommended operating free-air temperature range of –40°C to 125°C, AVDD = 4.5 V to 5.5 V, BVDD = 2.7 V to 5.5 V,
HVDD = 10 V to 15 V, HVSS = –15 V to –10 V, VREF = 2.5 V (internal), and fDATA = 670 kSPS in parallel mode or 470 kSPS in
serial mode (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP (1)
MAX UNIT
DC ACCURACY
Resolution
14
Bits
No missing codes
14
Bits
INL
Integral linearity error
–1
±0.4
1 LSB
DNL Differential linearity error
–1
±0.25
1 LSB
Offset error
–4
±0.8
4 mV
Offset error drift
±3.5
μV/°C
Gain error
Referenced to voltage at REFIO
–0.75
±0.25
0.75 %FSR
Gain error drift
Referenced to voltage at REFIO
±6
ppm/°C
PSRR Power-supply rejection ratio
At output code FFFFh, related to AVDD
60
dB
SAMPLING DYNAMICS
tACQ
tCONV
tCCLK
Acquisition time
Conversion time per ADC
Internal conversion clock period
280
ns
1.19
μs
18.5
64.1
tCCLK
ns
fDATA Throughput rate
Parallel interface, internal clock and reference
Serial interface, internal clock and reference
670
kSPS
470
AC ACCURACY
SNR
SINAD
THD
SFDR
Signal-to-noise ratio
Signal-to-noise ratio + distortion
Total harmonic distortion(2)
Spurious-free dynamic range
Channel-to-channel isolation
–3-dB small-signal bandwidth
At fIN = 10 kHz
At fIN = 10 kHz
At fIN = 10 kHz
At fIN = 10 kHz
At fIN = 10 kHz
In 4 × VREF mode
In 2 × VREF mode
84
85
dB
83
84
dB
–91
–86
dB
86
92
dB
100
dB
48
MHz
24
(1) All values are at TA = 25°C.
(2) Calculated on the first nine harmonics of the input frequency.
12
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