TIBPAL22VP10-20C_15 Datasheet, PDF (11/24 Pages) Texas Instruments – HIGH-PERFORMANCE IMPACT-X

Obsolete Device
TIBPAL22VP10-20C, TIBPAL22VP10-25M
HIGH-PERFORMANCE IMPACT-X ™ PROGRAMMABLE ARRAY LOGIC CIRCUITS
SRPS013 − D2943, FEBRUARY 1987 − REVISED JUNE 1991
preload procedure for registered outputs (see Notes 2 and 3)
The output registers can be preloaded to any desired state during device testing. This permits any state to be
tested without having to step through the entire state-machine sequence. Each register is preloaded individually
by following the steps given below:
Step 1. With V_CC at 5 V and pin 1 at V_IL, raise pin 13 to V_IHH.
Step 2. Apply either V_IL or V_IH to the output corresponding to the register to be preloaded.
Step 3. Pulse pin 1, clocking in preload data.
Step 4. Remove output voltage, then lower pin 13 to V_IL. Preload can be verified by observing the voltage level
at the output pin.
Pin 13
Pin 1
t_su
t_d
t_d
t_w
V_IHH
V_IL
V_IH
V_IL
Registered I/O
Input
V_IH
V_OH
Output
V_IL
V_OL
Figure 2. Preload Waveforms
NOTES: 2. Pin numbers shown are for JT and NT packages only. If chip-carrier socket adapter is not used, pin numbers must be changed
accordingly.
3. t_d = t_su = t_w = 100 ns to 1000 ns. V_IHH = 10.25 V to 10.75 V.
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