BQ27742-G1 Datasheet, PDF (11/46 Pages) Texas Instruments – Single-Cell Li-Ion Battery Fuel Gauge with Programmable Hardware Protection

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bq27742-G1
SLUSBV9C – MARCH 2014 – REVISED FEBRUARY 2016
6.18 Integrating ADC (Coulomb Counter) Characteristics
T_A = –40°C to 85°C, 2.4 V < V_REG25 < 2.6 V; typical values at T_A = 25°C and V_REG25 = 2.5 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
V_{SR_IN}
t_{SR_CONV}
Input voltage range, V_SRN and V_SRP V_SR = V_SRP – V_SRN
Conversion time
Single conversion
Resolution
V_VPWR – 0.125
14
V_VPWR + 0.125
1
15
V_{SR_OS}
INL
Z_{SR_IN}
I_{SR_LKG}
Input offset
Integral nonlinearity error
Effective input resistance⁽¹⁾
Input leakage current⁽¹⁾
10
±0.007%
7
±0.034%
0.3
(1) Assured by design. Not production tested.
UNIT
V
s
bits
μV
FSR
MΩ
μA
6.19 ADC (Temperature and Cell Voltage) Characteristics
T_A = –40°C to 85°C, 2.4 V < V_REG25 < 2.6 V; typical values at T_A = 25°C and V_REG25 = 2.5 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
V_{ADC_IN}
t_{ADC_CONV}
Input voltage range (V_BAT channel)
Input voltage range (other channels)
Conversion time
Resolution
V_SS – 0.125
5
V_SS – 0.125
1
125
14
15
V_{ADC_OS}
Z_ADC1
Z_ADC2
I_{ADC_LKG}
Input offset
Effective input resistance (TS) ⁽¹⁾
Effective input resistance (BAT)⁽¹⁾
Input leakage current⁽¹⁾
Not measuring cell voltage
Measuring cell voltage
1
55
55
100
0.3
(1) Assured by design. Not production tested.
UNIT
V
V
ms
bits
mV
MΩ
MΩ
kΩ
μA
6.20 Data Flash Memory Characteristics
T_A = –40°C to 85°C, 2.4 V < V_REG25 < 2.6 V; typical values at T_A = 25°C and V_REG25 = 2.5 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
t_DR
Data retention⁽¹⁾
Flash programming write-cycles ⁽¹⁾
10
20,000
t_WORDPROG
I_CCPROG
Word programming time⁽¹⁾
Flash-write supply current⁽¹⁾
2
5
10
UNIT
years
cycles
ms
mA
(1) Assured by design. Not production tested.
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