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LMH6551MAX_NOPB Datasheet, PDF (1/28 Pages) Texas Instruments – LMH6551 Differential, High Speed Op Amp
LMH6551
www.ti.com
SNOSAK7C – FEBRUARY 2005 – REVISED MARCH 2013
LMH6551 Differential, High Speed Op Amp
Check for Samples: LMH6551
FEATURES
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•23 370 MHz −3 dB Bandwidth (VOUT = 0.5 VPP)
• 50 MHz 0.1 dB Bandwidth
• 2400 V/µs Slew Rate
• 18 ns Settling Time to 0.05%
• −94/−96 dB HD2/HD3 @ 5 MHz
APPLICATIONS
• Differential AD Driver
• Video Over Twisted Pair
• Differential Line Driver
• Single End to Differential Converter
• High Speed Differential Signaling
• IF/RF Amplifier
• SAW Filter Buffer/Driver
DESCRIPTION
The LMH™6551 is a high performance voltage
feedback differential amplifier. The LMH6551 has the
high speed and low distortion necessary for driving
high performance ADCs as well as the current
handling capability to drive signals over balanced
transmission lines like CAT 5 data cables. The
LMH6551 can handle a wide range of video and data
formats.
With external gain set resistors, the LMH6551 can be
used at any desired gain. Gain flexibility coupled with
high speed makes the LMH6551 suitable for use as
an IF amplifier in high performance communications
equipment.
The LMH6551 is available in the space saving SOIC
and VSSOP packages.
Typical Application
Figure 1. Single Ended to Differential ADC Driver
RF
AV, RIN
V+
RS VI
RG
+
VS
a RT
VCM
-
RM RG
V-
RO
-
VO
+
RO
IN-
ADC
IN+
RF
For RM RG :
Av
VO # RF
VI RG
RIN
#
2RG(1 Av )
2 Av
DesignTarget:
1) Set RT
1
11
RS RIN
2) Set RM RT ||RS
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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
LMH is a trademark of Texas Instruments.
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All other trademarks are the property of their respective owners.
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PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2005–2013, Texas Instruments Incorporated