LME49610 Datasheet, PDF (1/21 Pages) National Semiconductor (TI) – High Performance, High Fidelity, High Current Audio Buffer

LME49610
www.ti.com
SNAS435B – APRIL 2008 – REVISED APRIL 2013
LME49610 High Performance, High Fidelity, High Current Audio Buffer
Check for Samples: LME49610
FEATURES
1
•2 Pin-Selectable Bandwidth and Quiescent
Current
• Pure Fidelity. Pure Performance
• Short Circuit Protection
• Thermal Shutdown
• TO–263 Surface-Mount Package
APPLICATIONS
• Headphone Amplifier Output Drive Stage
• Line Drivers
• Low Power Audio Amplifiers
• High-Current Operational Amplifier Output
Stage
• ATE Pin Driver Buffer
• Power Supply Regulator
DESCRIPTION
The LME49610 is a high performance, low distortion
high fidelity 250mA audio buffer. The LME49610 is
designed for a wide range of applications. When used
inside the feedback loop of an op amp, it increases
output current, improves capacitive load drive, and
eliminates thermal feedback.
The LME49610 offers a pin-selectable bandwidth: a
low current, 120MHz bandwidth mode that consumes
13mA and a wide 200MHz bandwidth mode that
consumes 19mA. In both modes the LME49610 has
a nominal 2000V/μs slew rate. Bandwidth is easily
adjusted by either leaving the BW pin unconnected,
connecting it to the V_EE pin or connecting a resistor
between the BW pin and the V_EE pin.
The LME49610 is fully protected through internal
current limit and thermal shutdown.
Low THD+N
Slew Rate
High Output Current
Bandwidth
Supply Voltage Range
Table 1. KEY SPECIFICATIONS
(V_OUT = 3V_RMS, f = 1kHz, Figure 27)
BW pin floating
BW connected to V_EE
VALUE
0.00003
2000
250
120
200
±2.25V ≤ V_DD ≤ ±22
UNIT
% (typ)
V/μs (typ)
mA (typ)
MHz (typ)
MHz (typ)
V
FUNCTIONAL BLOCK DIAGRAM
Thermal
Shutdown
I
I₁
D1 - D7
V_CC
Q5
Q3
IN
200:
Q1
Q2
OUT
BW
D8 - D14
Q4
Q6
I₂
V_EE
Figure 1. Functional Block Diagram
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2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
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