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LMC6024 Datasheet, PDF (1/22 Pages) National Semiconductor (TI) – Low Power CMOS Quad Operational Amplifier
LMC6024
www.ti.com
SNOS621D – AUGUST 2000 – REVISED MARCH 2013
LMC6024 Low Power CMOS Quad Operational Amplifier
Check for Samples: LMC6024
FEATURES
1
•2 Specified for 100 kΩ and 5 kΩ Loads
• High Voltage Gain 120 dB
• Low Offset Voltage Drift 2.5 μV/°C
• Ultra Low Input Bias Vurrent 40 fA
• Input Common-mode Range Includes V−
• Operating Range from +5V to +15V Supply
• Low Distortion 0.01% at 1 kHz
• Slew Rate 0.11 V/μs
• Micropower Operation 1 mW
APPLICATIONS
• High-impedance Buffer or Preamplifier
• Current-to-voltage Converter
• Long-term Integrator
• Sample-and-hold Circuit
• Peak Detector
• Medical Instrumentation
• Industrial Controls
DESCRIPTION
The LMC6024 is a CMOS quad operational amplifier
which can operate from either a single supply or dual
supplies. Its performance features include an input
common-mode range that reaches V−, low input bias
current and voltage gain (into 100 kΩ and 5 kΩ loads)
that is equal to or better than widely accepted bipolar
equivalents, while the power supply requirement is
less than 1 mW.
This chip is built with Texas Instrument's advanced
Double-Poly Silicon-Gate CMOS process.
See the LMC6022 datasheet for a CMOS dual
operational amplifier with these same features.
Connection Diagram
Top View
Figure 1. 14-Pin DIP and SOIC Package
See Package Number D0014A
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
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2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2000–2013, Texas Instruments Incorporated