TC211 Datasheet, PDF (6/13 Pages) Texas Instruments – 192- × 165-pixel ccd image sensor

TC211
192- × 165-PIXEL CCD IMAGE SENSOR
SOCS008B – JANUARY 1990
electrical characteristics over recommended operating range of supply voltage, T_A = – 10°C to 45°C
PARAMETER
MIN TYP†
MAX UNIT
Antiblooming disabled (see Note 3)
60
Dynamic range (see Note 2)
dB
Antiblooming enabled
57
Charge conversion factor
4
µV/e
Charge transfer efficiency (see Note 4)
0.99990 0.99998
Signal response delay time, τ (see Note 5 and Figure 5)
25
ns
Gamma (see Note 6)
0.97
0.98
0.99
Output resistance
700
800
Ω
Noise voltage
1/f noise (5 kHz)
Random noise, f = 100 kHz
370
nV/√Hz
70
Noise equivalent signal
150
electrons
Rejection ratio at 7.16 MHz
From ADB to OUT (see Note 7)
From SRG to OUT (see Note 8)
19
dB
37
Supply current
5
10 mA
IAG
1600
Input capacitance, Ci
SRG
25
pF
ABG
780
† _{All typical values are at TA = 25°C}
NOTES: 2. Dynamic range is – 20 times the logarithm of the mean noise signal divided by the saturation output signal.
3. For this test, the antiblooming gate must be biased at the intermediate level.
4. Charge transfer efficiency is one minus the charge loss per transfer in the output register. The test is performed in the dark using
an electrical input signal.
5. Signal response delay time is the time between the falling edge of the SRG clock pulse and the output signal valid state.
6. Gamma (γ) is the value of the exponent in the equation below for two points on the linear portion of the transfer function curve (this
ǒ Ǔ + ǒ Ǔ value represents points near saturation):
g
Exposure (2)
Output signal (2)
Exposure (1)
Output signal (1)
7. ADB rejection ratio is – 20 times the logarithm of the ac amplitude at the OUT divided by the ac amplitude at ADB.
8. SRG rejection ratio is – 20 times the logarithm of the ac amplitude at the OUT divided by the ac amplitude at SRG.
2-6
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