English
Language : 

MSP430G2X11_11 Datasheet, PDF (6/47 Pages) Texas Instruments – MIXED SIGNAL MICROCONTROLLER
MSP430G2x11
MSP430G2x01
SLAS695D – FEBRUARY 2010 – REVISED FEBRUARY 2011
www.ti.com
Table 2. Terminal Functions
TERMINAL
NAME
NO.
14
16
N, PW RSA
P1.0/
TA0CLK/
ACLK/
2
1
CA0
P1.1/
TA0.0/
3
2
CA1
P1.2/
TA0.1/
4
3
CA2
P1.3/
CA3/
5
4
CAOUT
P1.4/
SMCLK/
CA4/
6
5
TCK
P1.5/
TA0.0/
CA5/
7
6
TMS
P1.6/
TA0.1/
CA6/
8
7
TDI/TCLK
P1.7/
CA7/
CAOUT/
9
8
TDO/TDI (2)
XIN/
P2.6/
13
12
TA0.1
XOUT/
P2.7
12
11
RST/
NMI/
10
9
SBWTDIO
TEST/
SBWTCK
11
10
DVCC
1
16
DVSS
14
14
NC
-
15
QFN Pad
-
Pad
I/O
DESCRIPTION
General–purpose digital I/O pin
Timer0_A, clock signal TACLK input
I/O
ACLK signal output
Comparator_A+, CA0 input(1)
General–purpose digital I/O pin
I/O Timer0_A, capture: CCI0A input, compare: Out0 output
Comparator_A+, CA1 input(1)
General–purpose digital I/O pin
I/O Timer0_A, capture: CCI1A input, compare: Out1 output
Comparator_A+, CA2 input(1)
General–purpose digital I/O pin
I/O Comparator_A+, CA3 input(1)
Comparator_A+, output(1)
General–purpose digital I/O pin
SMCLK signal output
I/O
Comparator_A+, CA4 input(1)
JTAG test clock, input terminal for device programming and test
General–purpose digital I/O pin
Timer0_A, compare: Out0 output
I/O
Comparator_A+, CA5 input(1)
JTAG test mode select, input terminal for device programming and test
General–purpose digital I/O pin
Timer0_A, compare: Out1 output
I/O
Comparator_A+, CA6 input(1)
JTAG test data input or test clock input during programming and test
General–purpose digital I/O pin
CA7 input(1)
I/O
Comparator_A+, output(1)
JTAG test data output terminal or test data input during programming and test
Input terminal of crystal oscillator
I/O General–purpose digital I/O pin
Timer0_A, compare: Out1 output
Output terminal of crystal oscillator(3)
I/O
General–purpose digital I/O pin
Reset
I Nonmaskable interrupt input
Spy–Bi–Wire test data input/output during programming and test
Selects test mode for JTAG pins on Port 1. The device protection fuse is connected to TEST.
I
Spy–Bi–Wire test clock input during programming and test
NA Supply voltage
NA Ground reference
NA Not connected
NA QFN package pad connection to VSS recommended.
(1) MSP430G2x11 only
(2) TDO or TDI is selected via JTAG instruction.
(3) If XOUT/P2.7 is used as an input, excess current will flow until P2SEL.7 is cleared. This is due to the oscillator output driver connection
to this pad after reset.
6
Submit Documentation Feedback
© 2010–2011, Texas Instruments Incorporated