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MSP430G2X11_11 Datasheet, PDF (27/47 Pages) Texas Instruments – MIXED SIGNAL MICROCONTROLLER
MSP430G2x11
MSP430G2x01
www.ti.com
SLAS695D – FEBRUARY 2010 – REVISED FEBRUARY 2011
Flash Memory
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
TEST
CONDITIONS
VCC
MIN TYP MAX UNIT
VCC(PGM/ERASE)
fFTG
IPGM
IERASE
tCPT
tCMErase
Program and erase supply voltage
Flash timing generator frequency
Supply current from VCC during program
Supply current from VCC during erase
Cumulative program time(1)
Cumulative mass erase time
Program/erase endurance
2.2 V/3.6 V
2.2 V/3.6 V
2.2 V/3.6 V
2.2 V/3.6 V
2.2
3.6 V
257
476 kHz
1
5 mA
1
7 mA
10 ms
20
104 105
ms
cycles
tRetention
tWord
tBlock, 0
tBlock, 1-63
tBlock, End
tMass Erase
tSeg Erase
Data retention duration
Word or byte program time
Block program time for first byte or word
Block program time for each additional byte or
word
Block program end-sequence wait time
Mass erase time
Segment erase time
TJ = 25°C
(2)
(2)
(2)
(2)
(2)
(2)
100
30
25
18
6
10593
4819
years
tFTG
tFTG
tFTG
tFTG
tFTG
tFTG
(1) The cumulative program time must not be exceeded when writing to a 64-byte flash block. This parameter applies to all programming
methods: individual word/byte write and block write modes.
(2) These values are hardwired into the Flash Controller's state machine (tFTG = 1/fFTG).
RAM
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
V(RAMh)
PARAMETER
RAM retention supply voltage (1)
TEST CONDITIONS
MIN
CPU halted
1.6
MAX
UNIT
V
(1) This parameter defines the minimum supply voltage VCC when the data in RAM remains unchanged. No program execution should
happen during this supply voltage condition.
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