BQ27541 Datasheet, PDF (5/38 Pages) Texas Instruments – Single Cell Li-Ion Battery Fuel Gauge for Battery Pack Integration

bq27541
www.ti.com ........................................................................................................................................................................................... SLUS861 – DECEMBER 2008
LOW FREQUENCY OSCILLATOR
T_A = –40°C to 85°C, C_(REG) = 0.47µF, 2.45 V < V_(REGIN) = V_BAT < 5.5 V; typical values at T_A = 25°C and V_(REGIN) = V_BAT = 3.6 V
(unless otherwise noted)
f_OSC
f_EIO
t_SXO
PARAMETER
Operating frequency
Frequency error^{(1) (2)}
Start-up time⁽³⁾
TEST CONDITIONS
T_A = 0°C to 60°C
T_A = –20°C to 70°C
T_A = –40°C to 85°C
MIN
–1.5%
–2.5%
-4.0%
TYP
32.768
0.25%
0.25%
0.25%
MAX
1.5%
2.5%
4.0%
500
UNIT
KHz
µs
(1) The frequency drift is included and measured from the trimmed frequency at V_CC = 2.5 V, T_A = 25°C.
(2) The frequency error is measured from 32.768 KHz.
(3) The startup time is defined as the time it takes for the oscillator output frequency to be ±3% of typical oscillator frequency.
INTEGRATING ADC (COULOMB COUNTER) CHARACTERISTICS
T_A = –40°C to 85°C, C_(REG) = 0.47µF, 2.45 V < V_(REGIN) = V_BAT < 5.5 V; typical values at T_A = 25°C and V_(REGIN) = V_BAT = 3.6 V
(unless otherwise noted)
V_IN(SR)
t_CONV(SR)
V_OS(SR)
I_NL
Z_IN(SR)
I_lkg(SR)
PARAMETER
Input voltage range, V_(SRN) and V_(SRP)
Conversion time
Resolution
Input offset
Integral nonlinearity error
Effective input resistance⁽¹⁾
Input leakage current⁽¹⁾
TEST CONDITIONS
V_SR = V_(SRN) – V_(SRP)
Single conversion
MIN
–0.125
14
2.5
TYP
1
10
±0.007
MAX
0.125
15
±0.034
0.3
UNIT
V
s
bits
µV
FSR
MΩ
µA
(1) Specified by design. Not production tested.
ADC (TEMPERATURE AND CELL MEASUREMENT) CHARACTERISTICS
T_A = –40°C to 85°C, C_(REG) = 0.47µF, 2.45 V < V_(REGIN) = V_BAT < 5.5 V; typical values at T_A = 25°C and V_(REGIN) = V_BAT = 3.6 V
(unless otherwise noted)
V_IN(ADC)
t_CONV(ADC)
V_OS(ADC)
Z_(ADC1)
Z_(ADC2)
I_lkg(ADC)
PARAMETER
Input voltage range
Conversion time
Resolution
Input offset
Effective input resistance (TS) ⁽¹⁾
Effective input resistance (BAT)⁽¹⁾
Input leakage current⁽¹⁾
TEST CONDITIONS
bq27541 not measuring cell voltage
bq27541 measuring cell voltage
MIN TYP MAX UNIT
–0.2
1V
125 ms
14
15 bits
1
mV
8
MΩ
8
MΩ
100
kΩ
0.3 µA
(1) Specified by design. Not production tested.
DATA FLASH MEMORY CHARACTERISTICS
T_A = –40°C to 85°C, C_(REG) = 0.47µF, 2.45 V < V_(REGIN) = V_BAT < 5.5 V; typical values at T_A = 25°C and V_(REGIN) = V_BAT = 3.6 V
(unless otherwise noted)
t_DR
t_WORDPROG
I_CCPROG
PARAMETER
Data retention⁽¹⁾
Flash programming write-cycles ⁽¹⁾
Word programming time⁽¹⁾
Flash-write supply current⁽¹⁾
TEST CONDITIONS
MIN
10
20,000
TYP MAX UNIT
Years
Cycles
2 ms
5
10 mA
(1) Specified by design. Not production tested.
Copyright © 2008, Texas Instruments Incorporated
Product Folder Link(s): bq27541
Submit Documentation Feedback
5