LP2998MRX Datasheet, PDF (4/26 Pages) Texas Instruments – LP2998 DDR-I and DDR-II Termination Regulator

LP2998
SNVS521I – DECEMBER 2007 – REVISED APRIL 2013
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Electrical Characteristics (continued)
Specifications with standard typeface are for T_J = 25°C and limits in boldface type apply over the full Operating
Temperature Range (T_J = -40°C to +125°C) ⁽¹⁾. Unless otherwise specified, VIN = AVIN = PVIN = 2.5V.
Parameter
Test Conditions
Min Typ Max
I_OUT = 0A
VIN = VDDQ = 2.3V
1.120 1.159 1.190
VIN = VDDQ = 2.5V
1.210 1.259 1.290
V_TT Output Voltage (DDR I) ⁽²⁾
VIN = VDDQ = 2.7V
I_OUT = +/- 1.5A
VIN = VDDQ = 2.3V
1.320 1.359 1.390
1.125 1.159 1.190
VIN = VDDQ = 2.5V
1.225 1.259 1.290
VIN = VDDQ = 2.7V
1.325 1.359 1.390
I_OUT = 0A, AVIN = 2.5V
PVIN = VDDQ = 1.7V
0.822 0.856 0.887
PVIN = VDDQ = 1.8V
0.874 0.908 0.939
V_TT Output Voltage (DDR II) ⁽²⁾
PVIN = VDDQ = 1.9V
I_OUT = +/- 0.5A, AVIN = 2.5V
PVIN = VDDQ = 1.7V
0.923
0.820
0.957
0.856
0.988
0.890
PVIN = VDDQ = 1.8V
0.870 0.908 0.940
V_TT
PVIN = VDDQ = 1.9V
0.920 0.957 0.990
I_OUT = 0A, AVIN = 2.5V
PVIN = VDDQ = 1.35V
0.656 0.677 0.698
PVIN = VDDQ = 1.5V
0.731 0.752 0.773
PVIN = VDDQ = 1.6V
0.781 0.802 0.823
I_OUT = +0.2A, AVIN = 2.5V
PVIN = VDDQ = 1.35V
0.667 0.688 0.710
V_TT Output Voltage (DDR III) ⁽²⁾
I_OUT = -0.2A, AVIN = 2.5V
PVIN = VDDQ = 1.35V
I_OUT = +0.4A, AVIN = 2.5V
PVIN = VDDQ = 1.5V
0.641 0.673 0.694
0.740 0.763 0.786
I_OUT = -0.4A, AVIN = 2.5V
PVIN = VDDQ = 1.5V
0.731 0.752 0.773
I_OUT = +0.5A, AVIN = 2.5V
PVIN = VDDQ = 1.6V
0.790 0.813 0.836
V_TT Output Voltage Offset (V_REF – V_TT) for DDR I ⁽³⁾
V_TT Output Voltage Offset (V_REF – V_TT) for DDR II ⁽³⁾
VOS_Vtt
V_TT Output Voltage Offset (V_REF – V_TT) for DDR III ⁽³⁾
I_Q
Z_VDDQ
I_SD
Quiescent Current ⁽⁴⁾
VDDQ Input Impedance
Quiescent current in shutdown ⁽⁴⁾
I_OUT = -0.5A, AVIN = 2.5V
PVIN = VDDQ = 1.6V
I_OUT = 0A
I_OUT = -1.5A
I_OUT = +1.5A
I_OUT = 0A
I_OUT = -0.5A
I_OUT = +0.5A
I_OUT = 0A
I_OUT = ±0.2A
I_OUT = ±0.4A
I_OUT = ±0.5A
I_OUT = 0A
SD = 0V
0.781 0.802 0.823
-30
0
30
-30
0
30
-30
0
30
-30
0
30
-30
0
30
-30
0
30
-30
0
30
-30
0
30
-30
0
30
-30
0
30
320 500
100
115 150
Units
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
mV
mV
mV
mV
mV
mV
mV
mV
mV
mV
µA
kΩ
µA
(2) V_TT load regulation is tested by using a 10 ms current pulse and measuring V_TT.
(3) V_TT load regulation is tested by using a 10 ms current pulse and measuring V_TT.
(4) Quiescent current is defined as the current flow into AVIN.
4
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