JM38510-12501BGA Datasheet, PDF (3/21 Pages) Texas Instruments – LF198JAN Monolithic Sample-and-Hold Circuits

LF198JAN
www.ti.com
SNOSAJ2A – FEBRUARY 2005 – REVISED MARCH 2013
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
Absolute Maximum Ratings⁽¹⁾
Supply Voltage
Power Dissipation (Package Limitation)⁽²⁾
Operating Ambient Temperature Range
Storage Temperature Range
Maximum Junction Temperature (T_Jmax)
Input Voltage
Logic To Logic Reference Differential Voltage⁽³⁾
Output Short Circuit Duration
Hold Capacitor Short Circuit Duration
Lead Temperature (Soldering, 10 sec.)
Thermal Resistance
θ_JA
θ_JC
ESD Tolerance⁽⁴⁾
TO-99 (Still Air @ 0.5W)
TO-99 (500 LF/Min Air Flow @ 0.5W)
TO-99
±18V
500 mW
−55°C ≤T_A ≤ +125°C
−65°C to +150°C
+150°C
Equal to Supply Voltage
+7V, −30V
Indefinite
10 sec
300°C
160°C/W
84°C/W
48°C/W
500V
(1) “Absolute Maximum Ratings” indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the
Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may
degrade when the device is not operated under the listed test conditions
(2) The maximum power dissipation must be derated at elevated temperatures and is dictated by T_JMAX, θ_JA, and the ambient temperature,
T_A. The maximum allowable power dissipation at any temperature is P_D = (T_JMAX − T_A)/θ_JA, or the number given in the Absolute
Maximum Ratings, whichever is lower. .
(3) Although the differential voltage may not exceed the limits given, the common-mode voltage on the logic pins may be equal to the
supply voltages without causing damage to the circuit. For proper logic operation, however, one of the logic pins must always be at least
2V below the positive supply and 3V above the negative supply.
(4) Human body model, 100pF discharged through 1.5KΩ
Quality Conformance Inspection
Mil-Std-883, Method 5005 — Group A
Subgroup
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8B
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Description
Static tests at
Static tests at
Static tests at
Dynamic tests at
Dynamic tests at
Dynamic tests at
Functional tests at
Functional tests at
Functional tests at
Switching tests at
Switching tests at
Switching tests at
Temperature (°C)
+25°C
+125°C
−55°C
+25°C
+125°C
−55°C
+25°C
+125°C
−55°C
+25°C
+125°C
−55°C
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