TLC5952 Datasheet, PDF (2/33 Pages) Texas Instruments – 24-Channel, Constant-Current LED Driver with Global Brightness Control and LED Open-Short Detection

TLC5952
SBVS129 – MAY 2009........................................................................................................................................................................................................ www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION⁽¹⁾
PRODUCT
TLC5952
TLC5952
PACKAGE-LEAD
HTSSOP-32 PowerPAD™
5-mm × 5-mm QFN-32⁽²⁾
ORDERING NUMBER
TLC5952DAPR
TLC5952DAP
TLC5952RHBR
TLC5952RHBT
TRANSPORT MEDIA,
QUANTITY
Tape and Reel, 2000
Tube, 46
Tape and Reel, 3000
Tape and Reel, 250
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Product preview device.
ABSOLUTE MAXIMUM RATINGS⁽¹⁾⁽²⁾
Over operating free-air temperature range, unless otherwise noted.
V_CC
I_OUT
V_IN
V_OUT
T_J(max)
T_STG
PARAMETER
Supply voltage
Output current (dc)
V_CC
OUTR0-OUTR7, OUTG0-OUTG7
OUTB0-OUTB7
Input voltage range
SIN, SCLK, LAT, BLANK, IREF
Output voltage range
SOUT
OUTR0-OUTR7, OUTG0-OUTG7,
OUTB0-OUTB7
Operation junction temperature
Storage temperature range
ESD rating
Human body model (HBM)
Charged device model (CDM)
TLC5952
–0.3 to +6.0
45
35
–0.3 to V_CC + 0.3
–0.3 to V_CC + 0.3
–0.3 to +16
+150
–55 to +150
2000
500
UNIT
V
mA
mA
V
V
V
°C
°C
V
V
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values are with respect to network ground terminal.
2
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