THS4520 Datasheet, PDF (2/23 Pages) Texas Instruments – WIDEBAND, LOW NOISE, LOW DISTORTION FULLY DIFFERENTIAL AMPLIFIER WITH RAIL-TO-RAIL OUTPUTS

THS4520
SLOS503A – SEPTEMBER 2006 – REVISED OCTOBER 2006
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted)
V_S– to V_S+
V_I
V_ID
I_O
T_J
T_A
T_stg
Supply voltage
Input voltage
Differential input voltage
Output current⁽¹⁾
Continuous power dissipation
Maximum junction temperature
Maximum junction temperature, continuous operation, long term reliability
Operating free-air temperature range
Storage temperature range
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds
HBM
ESD ratings CDM
MM
UNIT
6V
±V_S
4V
200 mA
See Dissipation Rating Table
150°C
125°C
–40°C to 85°C
–65°C to 150°C
300°C
2000
1500
100
(1) The THS4520 incorporates a (QFN) exposed thermal pad on the underside of the chip. See TI technical brief SLMA002 and SLMA004
for more information about utilizing the QFN thermally enhanced package.
DISSIPATION RATINGS TABLE PER PACKAGE
PACKAGE ⁽¹⁾
RGT (16)
θ_JC
2.4°C/W
θ_JA
39.5°C/W
POWER RATING
T_A≤ 25°C
T_A = 85°C
2.3 W
225 mW
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
Web site at www.ti.com.
2
Submit Documentation Feedback