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BQ25040 Datasheet, PDF (2/25 Pages) Texas Instruments – 1.1A, Single-Input, Single Cell Li-Ion Battery Charger With 50mA LDO and 2.3A Production Test Support
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bq25040
SLUS910B – MARCH 2009 – REVISED MARCH 2009 ...................................................................................................................................................... www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
DESCRIPTION CONTINUED
The battery is charged in three phases: conditioning, constant current and constant voltage. In all charge phases,
an internal control loop monitors the IC junction temperature and reduces the charge current if an internal
temperature threshold is exceeded.
The charger power stage and charge current sense functions are fully integrated. The charger function has
accuracy current and voltage regulation loops, charge status display, and charge termination.
PART NUMBER (1)
bq25040DQCR
bq25040DQCT
VBAT(REG)
4.2V
4.2V
ORDERING INFORMATION
VOVP
6.9V
6.9V
(1) The DQC package is available in the following options:
R - taped and reeled in quantities of 3,000 devices per reel.
T - taped and reeled in quantities of 250 devices per reel.
VLDO
4.9V
4.9V
MARKING
OAB
OAB
ABSOLUTE MAXIMUM RATINGS(1)
over operating free-air temperature range (unless otherwise noted)
Input voltage
Output voltage
Input current (Continuous)
Input current (Pulsed)
Output current (Continuous)
Output current (Pulsed)
Output current (Continuous)
Output sink current
Junction temperature, TJ
Storage temperature, Tstg
IN (with respect to VSS)
EN/SET, ISET, IFULL (with respect to VSS)
BAT, CHG, PG (with respect to VSS)
LDO (with respect to VSS)
IN
IN, 20% duty cycle with 10 ms period
BAT
BAT, 20% duty cycle with 10 ms period
LDO
CHG, PG
VALUE
–0.3 to 30
–0.3 to 7
–0.3 to 7
-0.3 to 7(2)
1.5
2.5
1.5
2.5
100
15
–40 to 150
–65 to 150
UNIT
V
V
V
V
A
A
A
A
mA
mA
°C
°C
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. All voltage
values are with respect to the network ground terminal unless otherwise noted.
(2) If VLDO is greater than VIN, current must be limited to less than 100mA or damage may occur.
DISSIPATION RATINGS(1)
PACKAGE
10 Pin 2mm × 3mm SON
RθJA
58.7 °C/W
RθJC
3.9 °C/W
(1) This data is based on using the JEDEC High-K board and the exposed die pad is connected to a Cu pad on the board. The pad is
connected to the ground plane by a 2x3 via matrix.
2
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