BQ24030 Datasheet, PDF (2/20 Pages) Texas Instruments – SINGLE-CHIP CHARGE AND SYSTEM POWER-PATH MANAGEMENT IC (bqTINYI)

bq24030, bq24032, bq24035
SLUS618 – AUGUST 2004
www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device
placed in conductive foam during storage or handling to prevent electrostatic damage to the MOSFET
gates.
T_A
-40°C to 125°C
OUTPUT
VOLTAGE (V)
4.2
4.2
4.2
ORDERING INFORMATION
OUT PIN FOR AC
INPUT CONDITIONS
Regulated to 6 V
Regulated to 4.4 V
Cut off at 6 V
PART
NUMBER ^{(1) (2)}
bq24030RHLR
bq24032RHLR
bq24035RHLR
STATUS
Preview
Released
Preview
PACKAGE
MARKING
ANB
AMZ
ANA
(1) The RHL package isavailable taped and reeled only in quantities of 3,000 devices perreel.
(2) This product is RoHScompatible, including a lead concentration that does not exceed 0.1% of totalproduct weight, and is suitable for use
in specified lead-free solderingprocesses. In addition, this product uses package materials that do not containhalogens, including
bromine (Br) or antimony (Sb) above 0.1% of total productweight.
ABSOLUTE MAXIMUM RATINGS⁽¹⁾
over operating free-air temperature range (unless otherwise noted)
Input voltage
AC (DC voltage wrt VSS)
Input voltage
BAT, CE, DPPM, ACPG, PSEL, OUT, ISET1, ISET2,
STAT1, STAT2, TS, USBPG (all DC voltages wrt VSS)
LDO (DC voltage wrt VSS)
Input current
AC
USB
Output current
OUT
BAT ⁽²⁾
Output source current (in regulation at
3.3 V LDO)
LDO
Output sink current
ACPG, STAT1, STAT2, USBPG,
Storage temperature range, T_stg
Junction temperature range, T_J
Lead temperature (solderig, 10 seconds)
bq24030
bq24032
bq24035
-0.3 to 18
-0.3 to 7
-0.3 to V_O(OUT) + 0.3
2.75
600
4
-4 to 1.75
30
1.5
-65 to 150
-40 to 150
300
UNIT
V
A
mA
A
mA
°C
(1) Stresses beyond thoselisted under "absolute maximum ratings" may cause permanent damage to thedevice. These are stress ratings
only, and functional operation of the deviceat these or any other conditions beyond those indicated under "recommendedoperating
conditions" is not implied. Exposure to absolute-maximum-ratedconditions for extended periods may affect device reliability. All
voltagevalues are with respect to the network ground terminal unless otherwisenoted.
(2) Negative current isdefined as current flowing into the BAT pin.
2