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CC3000EM Datasheet, PDF (18/22 Pages) Texas Instruments – TI CC3000 Evaluation Module
www.ti.com
SWRU326-010
Figure 3-3. Trace Design for the PCB Layout
SWRU326-015
Figure 3-4. Layer 1 Combined With Layer 2
Table 3-2. Trace Design Measurement Values
Measurement
H (height between L1 and L2)
W (RF trace)
T (thickness)
S (separation)
εr (dielectric)
Length
12.0 mil
14.3 mil
1.2 mil
10.0 mil
4.3
18 Layout Guidelines
Copyright © 2012, Texas Instruments Incorporated
SWRU326 – November 2012
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